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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

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Author:  Choi, W.K.

Results 81-100 of 179 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
812008Influence of substrate geometry on the distribution and stress on Ge nanocrystals in silicon oxide matrixZheng, F.; Choi, W.K. ; Liew, T.H. 
821999Infra-red, X-ray photoelectron spectroscopy and electrical studies of r.f. sputtered amorphous silicon carbide filmsHan, L.J.; Ong, T.Y.; Prakash, S. ; Chua, L.G.; Choi, W.K. ; Tan, L.S. ; Loh, F.C. ; Tan, K.L. 
831-May-1998Infrared and x-ray photoelectron spectroscopy studies of as-prepared and furnace-annealed radio-frequency sputtered amorphous silicon carbide filmsChoi, W.K. ; Ong, T.Y.; Tan, L.S. ; Loh, F.C. ; Tan, K.L. 
8415-Apr-2003Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanismsChim, W.K. ; Ng, T.H.; Koh, B.H.; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.
851-Jul-2002Interfacial reactions of Ni on Si 1-xGe x (x=0.2,0.3) at low temperature by rapid thermal annealingZhao, H.B.; Pey, K.L. ; Choi, W.K. ; Chattopadhyay, S.; Fitzgerald, E.A.; Antoniadis, D.A.; Lee, P.S.
862010Interference lithographically defined and catalytically etched, large-area silicon nanocones from nanowiresDawood, M.K.; Liew, T.H. ; Lianto, P.; Hong, M.H. ; Tripathy, S.; Thong, J.T.L. ; Choi, W.K. 
872008Investigation of effect of germanium on the crystallization process of hafnium aluminum oxide matrixZheng, F.; Choi, W.K. ; Chew, H.G.; Chan, L.
8818-May-2001Investigation of Ge nanocrystal formation in SiO2-Ge-SiO2 sandwich structureChoi, W.K. ; Ng, V. ; Swee, V.S.L.; Ong, C.S.; Yu, M.B.; Rusli; Yoon, S.F.
8915-Apr-2004Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy filmsFeng, W.; Choi, W.K. 
1020-Mar-2002Investigation on oxide growth mechanism of PECVD silicon carbide filmsChoi, W.K. ; Leoy, C.C.; Lee, L.P.
1115-Mar-2000Investigations on the morphology of silicon surfaces anisotropically etched with TMAHThong, J.T.L. ; Bai, Y. ; Luo, P.; Choi, W.K. 
1215-Mar-2000Investigations on the morphology of silicon surfaces anisotropically etched with TMAHThong, J.T.L. ; Bai, Y. ; Luo, P.; Choi, W.K. 
132002Length effects on the reliability of dual-damascene Cu interconnectsWei, F.; Gan, C.L.; Thompson, C.V.; Clement, J.J.; Hau-Riege, S.P.; Pey, K.L. ; Choi, W.K. ; Tay, H.L.; Yu, B.; Radhakrishnan, M.K.
141-Jan-1993Logarithmic time dependence of pMOSFET degradation observed from gate capacitanceLing, C.H. ; Yeow, Y.T.; Ah, L.K.; Yung, W.H.; Choi, W.K. 
151-Jan-1993Logarithmic time dependence of pMOSFET degradation observed from gate capacitanceLing, C.H. ; Yeow, Y.T.; Ah, L.K.; Yung, W.H.; Choi, W.K. 
162002Manipulation of germanium nanocrystals in a tri-layer insulator structure of a metal-insulator-semiconductor memory deviceTeo, L.W.; Heng, C.L. ; Ho, V.; Tay, M.; Choi, W.K. ; Chim, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.
172003Material and electrical characterization of HfO2 films for MIM capacitors applicationHu, H.; Zhu, C. ; Lu, Y.F. ; Wu, Y.H. ; Liew, T. ; Li, M.F. ; Cho, B.J. ; Choi, W.K. ; Yakovlev, N.
1810-Aug-1993Measurement of the current transient in Ta2O5 filmsSundaram, K.; Choi, W.K. ; Ling, C.H. 
1910-Oct-2013Mechanics of catalyst motion during metal assisted chemical etching of siliconLai, C.Q.; Cheng, H.; Choi, W.K. ; Thompson, C.V.
2015-Feb-2001Microstructural and photoluminescence studies of germanium nanocrystals in amorphous silicon oxide filmsChoi, W.K. ; Ho, Y.W.; Ng, S.P.; Ng, V.