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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 1-20 of 50 (Search time: 0.008 seconds).

Issue DateTitleAuthor(s)
1Jun-2013A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscopeChen, R.; Agarwal, K. ; Sheppard, C.J.R.; Phang, J.C.H. ; Chen, X. 
22007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
32004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
42005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
52005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
62005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
72000Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure AnalysisPalaniappan, M. ; Chin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
82009Applications of scanning near-field photon emission microscopyIsakov, D.V.; Tan, B.W.M.; Phang, J.C.H. ; Yeo, Y.C. ; Tio, A.A.B.; Zhang, Y.; Geinzer, T.; Balk, L.J.
92008Applications of scanning Near-field photon emission microscopyIsakov, D.; Tan, B.; Phang, J. ; Yeo, Y. ; Tio, A.; Zhang, Y.; Geinzer, T.; Balk, L.
102000Automatic IC Die Positioning in the SEMTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
112002Automatic integrated circuit die positioning in the scanning electron microscopeTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
121-Mar-2000Can physical analysis aid in device characterization?Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H.
132011Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning techniqueMeng, L.; Steen, S.; Koo, C.K. ; Bhatia, C.S. ; Street, A.G.; Joshi, P.; Kim, Y.H.; Phang, J.C.H. 
142001Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)Lee, T.H. ; Fiege, G.B.M.; Altes, A.; Zimmermann, G.; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
15Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
16Nov-2012Complete modeling of subsurface microscopy system based on aplanatic solid immersion lensChen, R.; Agarwal, K. ; Zhong, Y.; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
172000Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting deviceHeiderhoff, R.; Palaniappan, M. ; Phang, J.C.H. ; Balk, L.J.
182006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
192007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
202010Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performanceJoshi, P.; Steen, S.; Sivakumar, K.; Yang, W.K.; Rossnagel, S.; Mittal, S.; Steiner, M.; Neumayer, D.; Kim, Y.H.; Nagalingam, D. ; Meng, L.; Bhatia, C.S. ; Phang, J.C.H.