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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 121-140 of 151 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1212012Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopyMeng, L.; Rao, S.S.P.; Bhatia, C.S. ; Steen, S.E.; Street, A.G.; Phang, J.C.H. 
22009Optical near-field probe with embedded gallium scattering centerIsakov, D.V.; Zhang, Y.; Balk, L.J.; Phang, J.C.H. 
3Jul-1994Optoelectronic material analysis and device failure analysis using SEM cathodoluminescencePey, K.L. ; Chim, W.K. ; Phang, J.C.H. ; Chan, D.S.H. 
421-Jul-1999Properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrateLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
529-Apr-2003Pulsed single contact optical beam induced current analysis of integrated circuitsMIN, CHIN JIANN; KOLACHINA, SIVARAMAKRISHNA; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
61995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
7Jul-1997Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBICOsipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
82009Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplificationHo, H.W.; Zheng, X.H.; Phang, J.C.H. ; Balk, L.J.
92009Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysisPhang, J.C.H. ; Gohl, S.H.; Quah, A.C.T.; Chua, M.; Koh, L.S.; Tan, S.H.; Chua, W.P.
10Jun-2012Resolution of aplanatic solid immersion lens based microscopyChen, R.; Agarwal, K. ; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
1129-Oct-1996Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimensPHANG, J. C. H. ; CBIM, W. K. ; CHAN, D. S. H. ; LIU, Y. Y. 
1228-Jun-2005Rotational stage for high speed, large area scanning in focused beam systemsLIU, YONG YU ; CHAN, DANIEL S. H. ; PHANG, JACOB C. H. 
1317-Aug-2004Rotational stage for high speed, large area scanning in focused beam systemsLIU, YONG YU ; CHAN, DANIEL S. H. ; PHANG, JACOB C. H. 
142000Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & MicrocharacterisationWong, W.K.; Yin, Q.R.; Thong, J.T.L. ; Phang, J.C.H. ; Fang, J.W.
152008Scanning near-field photon emission microscopyIsakov, D.; Geinzer, T.; Tio, A.; Phang, J.C.H. ; Zhang, Y.; Balk, L.J.
162010SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cellsMeng, L.; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G.; Phang, J.C.H. 
1719-Aug-2003Selective deposition of a particle beam based on charging characteristics of a sampleKIN, WONG WAI ; PHANG, JACOB C. H. ; THONG, JOHN 
18Aug-1993Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscopeChan, Daniel S.H. ; Pey, Kin Leong ; Phang, Jacob C.H. 
19Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
202013Single contact electron beam induced current technique for solar cell characterizationMeng, L.; Street, A.G.; Phang, J.C.H. ; Bhatia, C.S.