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Chan Siu Hung,Daniel

rp07001

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Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
Main Affiliation
 
Faculty
 
Email
elecshd@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1990 TO 1999]
Date Issued:  1999

Results 1-17 of 17 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
11999An improved drain-current-conductance method with substrate back-biasingTan, C.B.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
2Jan-1999Carbon nitride thin films deposited by nitrogen-ion-assisted KRF excimer ablation of graphiteFeng, L.Y. ; Min, R.Z.; Qiao, N.H.; Feng, H.Z.; Chan, D.S.H. ; Seng, L.T. ; Yin, C.S.; Gamani, K. ; Geng, C. ; Kun, L.
31999Channel-width effect on hot-carrier degradation in NMOSFETs with recessed-LOCOS isolation structuresYue, J.M.P.; Chim, W.K. ; Cho, B.J. ; Chan, D.S.H. ; Qin, W.H.; Kim, Y.B.; Jang, S.A.; Yeo, I.S.
41999Charge trapping as the dominant degradation mechanism during plasma processing of 0.25 μm technology devicesSong, J.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
51999Comparative study of charge trapping effects in LDD surface-channel and buried-channel PMOS transistors using charge profiling and threshold voltage shift measurementsKok, C.K.; Chew, W.C.; Chim, W.K. ; Chan, D.S.H. ; Leang, S.E.
6Jul-1999DC voltage-voltage method to measure the interface traps in sub-micron MOSTsJie, B.B.; Li, M.F. ; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
71999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
81999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
92-Sep-1999Investigation of light emitting diodes using nuclear microprobesYang, C. ; Bettiol, A.; Jamieson, D.; Hua, X.; Phang, J.C.H. ; Chan, D.S.H. ; Watt, F. ; Osipowicz, T. 
101999New DC voltage-voltage method to measure the interface traps in deep sub-micron MOS transistorsJie, B.B.; Li, M.F. ; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
111999Performance spread optimization of MOS VLSI circuit by statistical parameter designChen, H.M.; Samudra, G.S. ; Chan, D.S.H. ; Ibrahim, Y. 
1221-Jul-1999Properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrateLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
135-Oct-1999Pulse laser induced removal of mold flash on integrated circuit packagesLU, YONG FENG ; CHAN, DANIEL SIU HUNG ; LOW, TECK SENG 
141999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
151999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
161999Study on LED degradation using CL, EBIC and a two-diode parameter extraction modelXiao, H.; Liu, Y.Y.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Yan, K.P.
171999Yield optimization by design centering & worst-case distance analysisSamudra, G.S. ; Chen, H.M.; Chan, D.S.H. ; Ibrahim, Yaacob