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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 101-120 of 184 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1012-Apr-1999Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7-δ thin filmsOsipowicz, T. ; Xu, X.Y.; Yang, C. ; Zhou, W.Z.; Ong, C.K. ; Watt, F. 
102Mar-2000Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicidesLee, P.S.; Mangelinck, D.; Pey, K.L. ; Shen, Z.X. ; Ding, J. ; Osipowicz, T. ; See, A.
103Jul-2001Micro-RBS study of nickel silicide formationSeng, H.L. ; Osipowicz, T. ; Lee, P.S.; Mangelinck, D.; Sum, T.C. ; Watt, F. 
104Jul-1997Micromachining using deep ion beam lithographySpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Gan, L.H.; Watt, F. 
1051999Micromachining using focused high energy ion beams: Deep Ion Beam LithographyVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
614-May-1998MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
725-Aug-1999MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
824-Sep-2002Micromachining using high energy light ionsWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
9Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
103-May-2007Morphology controllable ZnO growth on facet-controlled epitaxial lateral overgrown GaN/sapphire templatesZhou, H.L.; Chua, S.J.; Pan, H. ; Zhu, Y.W. ; Osipowicz, T. ; Liu, W.; Zang, K.Y.; Feng, Y.P. ; Sow, C.H. 
11Jul-2007Nano-imaging of single cells using STIMMinqin, R. ; van Kan, J.A. ; Bettiol, A.A. ; Daina, L.; Gek, C.Y.; Huat, B.B.; Whitlow, H.J.; Osipowicz, T. ; Watt, F. 
1216-Jul-2009Nanoflake CoN as a high capacity anode for Li-ion batteriesDas, B.; Reddy, M.V. ; Malar, P. ; Osipowicz, T. ; Subba Rao, G.V. ; Chowdari, B.V.R. 
13Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
1420-Nov-2002Nickel silicidation on polycrystalline silicon germanium filmsChoi, W.K. ; Pey, K.L. ; Zhao, H.B.; Osipowicz, T. ; Shen, Z.X. 
152007Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETsLee, R.T.P. ; Liow, T.-Y.; Tan, K.-M.; Lim, A.E.-J.; Ho, C.-S.; Hoe, K.-M.; Lai, M.Y.; Osipowicz, T. ; Lo, G.-Q.; Samudra, G. ; Chi, D.-Z.; Yeo, Y.-C. 
16Mar-1998Nuclear microprobe analysis and imaging: Current state of the art performancesWatt, F. ; Osipowicz, T. ; Choo, T.F.; Orlic, I. ; Tang, S.M. 
172-Sep-1995Nuclear microscopy of rubies: trace elements and inclusionsOsipowicz, T. ; Tay, T.S.; Orlic, I. ; Tang, S.M. ; Watt, F. 
18Feb-2013Objective improvement of the visual quality of ion microscope imagesNorarat, R.; Whitlow, H.J.; Ren, M. ; Osipowicz, T. ; Van Kan, J.A. ; Timonen, J.; Watt, F. 
192005Observation of a new kinetics to form Ni3Si2 and Ni31Si12 suicides at low temperature (200°C)Rahman, Md..A.; Osipowicz, T. ; Chi, D.Z.; Wang, W.D.
20Nov-2005Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S.