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Wai Kin Chim

rp04472

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Full Name
Wai Kin Chim
Variants
CHIM, WAI KIN
Chim, W.-K.
CBIM, W. K.
CHIM, WAI K.
Chim, W.K.
KIN, CHIM WAI
Chim Wai Kin
 
Main Affiliation
 
Faculty
 
Email
elecwk@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1950 TO 1999]

Results 1-20 of 89 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Jun-1996A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscopeChim, W.K. 
2Jul-1997A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junction MOSFET'sLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
3Oct-1995A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETsLeang, S.E.; Chim, W.K. ; Chan, D.S.H. 
41995A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscopeChim, W.K. 
51994An analytical model for scanning electron microscope Type I magnetic contrast with energy filteringChim, W.K. 
61-Nov-1997An analytical model for Type I magnetic contrast enhancement with sample tiltingChim, W.K. 
7Jun-1995An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodesPey, K.L.; Chim, W.K. ; Koh, L.S.; Liu, Y.Y.; Chew, S.Y.C. 
8Jun-1993An energy dependent model for type I magnetic contrast in the scanning electron microscopeChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
91999An improved drain-current-conductance method with substrate back-biasingTan, C.B.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
101997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
11Sep-1995Atomic and magnetic force microscopy imaging of thin-film recording headsChim, W.K. 
12Mar-1994Building-in reliability for silver die attached light emitting diodesChim, W.K. ; Chong, K.Y.
131997Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structuresLiu, X.; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
141998Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiencyPhang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Liu, Y.Y.; Liu, X.
151999Channel-width effect on hot-carrier degradation in NMOSFETs with recessed-LOCOS isolation structuresYue, J.M.P.; Chim, W.K. ; Cho, B.J. ; Chan, D.S.H. ; Qin, W.H.; Kim, Y.B.; Jang, S.A.; Yeo, I.S.
161995Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement techniqueLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
171997Characterization of the plasma-induced effective mobility degradation of LATID NMOSFETsLou, C.L.; Song, J.; Tan, C.B.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y. 
181999Charge trapping as the dominant degradation mechanism during plasma processing of 0.25 μm technology devicesSong, J.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
191999Comparative study of charge trapping effects in LDD surface-channel and buried-channel PMOS transistors using charge profiling and threshold voltage shift measurementsKok, C.K.; Chew, W.C.; Chim, W.K. ; Chan, D.S.H. ; Leang, S.E.
201995Comparative study on the channel hot-carrier degradation of N- and P-MOSFETs with CVD tungsten polycide gateLow, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.