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|Title:||An analytical model for Type I magnetic contrast enhancement with sample tilting||Authors:||Chim, W.K.||Issue Date:||1-Nov-1997||Citation:||Chim, W.K. (1997-11-01). An analytical model for Type I magnetic contrast enhancement with sample tilting. Journal of Applied Physics 82 (9) : 4143-4147. ScholarBank@NUS Repository.||Abstract:||In this article, an analytical model for Type I magnetic contrast enhancement in the scanning electron microscope, achieved by sample tilting, is presented. The model accounts for the energy filtering of the secondary electrons emitted from the sample. The results showed that the optimum sample tilt angle for maximum contrast is a function of the field-distance integral. For small field-distance integrals less than 10-7 Tm, corresponding to a weak magnetic field situation, the optimum sample tilt is close to 0°. For large field-distance integrals, the optimum sample tilt angle increases and approaches 45° for a field-distance integral of 8×10-6 Tm. © 1997 American Institute of Physics.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/80289||ISSN:||00218979|
|Appears in Collections:||Staff Publications|
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