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Pey Kin Leong

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Full Name
Pey Kin Leong
Variants
PEY, KIN-LEONG
PEY, KIN L.
LEONG, KIN
Pey, Kin Leong
PEY, KIN LEONG
Pey, K.L.
 
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Faculty
 

Publications

Results 61-73 of 73 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
61Aug-1993Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscopeChan, Daniel S.H. ; Pey, Kin Leong ; Phang, Jacob C.H. 
62Aug-1993Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscopeChan, Daniel S.H. ; Pey, Kin Leong ; Phang, Jacob C.H. 
631-Jan-2000Structural characterization of rapid thermal oxidized Si1-x-yGexCy alloy films grown by rapid thermal chemical vapor depositionChoi, W.K. ; Chen, J.H. ; Bera, L.K. ; Feng, W.; Pey, K.L. ; Mi, J.; Yang, C.Y.; Ramam, A. ; Chua, S.J. ; Pan, J.S. ; Wee, A.T.S. ; Liu, R. 
41-Jun-2000Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy filmsChoi, W.K. ; Bera, L.K. ; Chen, J.H. ; Feng, W.; Pey, K.L. ; Yoong, H.; Mi, J.; Zhang, F.; Yang, C.Y.
52000Study of implanted boron distribution in p+n structures using scanning capacitance microscopyTeo, Y.L.; Pey, K.L. ; Chim, W.K. ; Chong, Y.F.
62001Study of the morphological modifications induced by laser annealing of preamorphized siliconChong, Y.F.; Pey, K.L. ; Lu, Y.F. ; Wee, A.T.S. ; See, A.
7Sep-2004The interfacial reaction of Ni with (111)Ge, (100)Si0.75Ge 0.25 and (100)Si at 400 °CJin, L.J.; Pey, K.L. ; Choi, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.; Pitera, A.J.; Lee, M.L.; Chi, D.Z.; Tung, C.H.
8May-2003The statistical distribution of percolation current for soft breakdown in ultrathin gate oxideLin, W.H.; Pey, K.L. ; Dong, Z.; Chooi, S.Y.M. ; Ang, C.H.; Zheng, J.Z.
9May-2003The statistical distribution of percolation current for soft breakdown in ultrathin gate oxideLin, W.H.; Pey, K.L. ; Dong, Z.; Chooi, S.Y.M. ; Ang, C.H.; Zheng, J.Z.
10Nov-2002Thermal reaction of nickel and Si0.75Ge0.25 alloyPey, K.L. ; Choi, W.K. ; Chattopadhyay, S.; Zhao, H.B.; Fitzgerald, E.A.; Antoniadis, D.A.; Lee, P.S.
111999Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formationHo, C.S.; Pey, K.L. ; Tung, C.H.; Tee, K.C.; Prasad, K.; Saigal, D.; Tan, J.J.L.; Wong, H.; Lee, K.H.; Osipowicz, T. ; Chua, S.J. ; Karunasiri, R.P.G. 
1225-Jul-2000Ultra-low sheet resistance metal/poly-si gate for deep sub-micron CMOS applicationLIM, CHONG WEE; PEY, KIN LEONG ; SIAH, SOH YUN; LIM, ENG HWA ; CHAN, LAP
13Nov-2001X-ray photoemission spectroscopy study of silicidation of Ti on BF2 +-implanted polysiliconChua, H.N.; Pey, K.L. ; Lai, W.H.; Chai, J.W.; Pan, J.S.; Chua, D.H.C.; Siah, S.Y.