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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 41-60 of 151 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
411994Charging dynamics of integrated circuit passivation layer probe holes in the electron beam testerPhang, J.C.H. ; Sim, K.S. ; Chan, D.S.H. 
421997Charging identification and compensation in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
32008Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessorsQuah, A.C.T.; Goh, S.H.; Ravikumar, V.K.; Phoa, S.L.; Narang, V.; Chin, J.M.; Chua, C.M.; Phang, J.C.H. 
42010Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysisGoh, S.H.; Quah, A.C.T.; Ravikumar, V.K.; Phoa, S.L.; Narang, V.; Chin, J.M.; Chua, C.M.; Phang, J.C.H. 
5Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
6Nov-2012Complete modeling of subsurface microscopy system based on aplanatic solid immersion lensChen, R.; Agarwal, K. ; Zhong, Y.; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
71999Correlation of Electronic and Thermal Properties of Short Channel nMOSFETSPalaniappan, M. ; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Fiege, G.B.M.; Balk, L.J.
82004Correlation of flash memory defects detected with passive and active localization techniquesQuah, A.C.T.; Phang, J.C.H. ; Li, S.; Massoodi, M.; Yuan, C.; Koh, L.S.; Chan, K.H.; Chua, C.M.
92000Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting deviceHeiderhoff, R.; Palaniappan, M. ; Phang, J.C.H. ; Balk, L.J.
102006DC-coupled laser induced detection system for fault localization in microelectronic failure analysisQuah, A.C.T.; Koh, L.S.; Chua, C.M.; Palaniappan, M.; Chin, J.M.; Phang, J.C.H. 
112005Dedicated near-field microscopies for electronic materials and devicesBalk, L.J.; Cramer, R.M.; Heiderhoff, R.; Phang, J.Ch. ; Sergeev, O.; Tiedemann, A.-K.
121996Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factorWittpahl, V.; Liu, Y.Y.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J.; Yan, K.P.
131996Design and characterisation of a single-reflection, solid-state detector with high discrimination against backscattered electrons for cathodoluminescence microscopyPey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Leong, Y.K.
14Jul-1996Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devicesChan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. 
152009Design considerations for refractive solid immersion lens: Application to subsurface integrated circuit fault localization using laser induced techniquesGoh, S.H.; Sheppard, C.J.R. ; Quah, A.C.T.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
162006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
172007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
1815-Oct-1998Determination of secondary electron yield from insulators due to a low-kV electron beamYong, Y.C.; Thong, J.T.L. ; Phang, J.C.H. 
192010Determination of the local electric field strength by energy dispersive Photon Emission MicroscopyGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
202010Determination of the local electric field strength near electric breakdownGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.