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|Title:||Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor||Authors:||Wittpahl, V.
|Issue Date:||1996||Citation:||Wittpahl, V.,Liu, Y.Y.,Chan, D.S.H.,Chim, W.K.,Phang, J.C.H.,Balk, L.J.,Yan, K.P. (1996). Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor. Annual Proceedings - Reliability Physics (Symposium) : 188-194. ScholarBank@NUS Repository.||Abstract:||A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between `good' and `bad' devices. A corresponding method using the variation of the junction ideality factor during stressing is also described.||Source Title:||Annual Proceedings - Reliability Physics (Symposium)||URI:||http://scholarbank.nus.edu.sg/handle/10635/72556||ISSN:||00999512|
|Appears in Collections:||Staff Publications|
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