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Yuan Ping Feng

rp00403

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Full Name
Yuan Ping Feng
Variants
Feng, Y.-P.
Ping Feng, Y.
Yuanping, F.
Feng Y.P.
Feng, Y.
Yuan-Ping, F.
Feng, Yuan Ping
Feng, Y.P.
Feng, Y.-Y.
Feng, Yuan-ping
Yuan Ping Feng
 
Main Affiliation
 
Faculty
 
Email
phyfyp@nus.edu.sg
 

Publications

Refined By:
Department:  ELECTRICAL & COMPUTER ENGINEERING
Author:  Feng, Y.P.
Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 1-20 of 30 (Search time: 0.011 seconds).

Issue DateTitleAuthor(s)
128-Oct-2011Bandgap engineering of zigzag graphene nanoribbons by manipulating edge states via defective boundariesZhang, A. ; Wu, Y. ; Ke, S.-H.; Feng, Y.P. ; Zhang, C. 
214-Mar-2011C-doped ZnO nanowires: Electronic structures, magnetic properties, and a possible spintronic deviceDai, Z. ; Nurbawono, A.; Zhang, A. ; Zhou, M.; Feng, Y.P. ; Ho, G.W. ; Zhang, C. 
321-Feb-2004Carbon nanowalls and related materialsWu, Y. ; Yang, B.; Zong, B.; Sun, H.; Shen, Z. ; Feng, Y. 
428-Oct-2012Cationic-vacancy-induced room-temperature ferromagnetism in transparent, conducting anatase Ti 1-xTa xO 2 (x ∼0.05) thin filmsRusydi, A. ; Dhar, S. ; Roy Barman, A.; Ariando ; Qi, D.-C. ; Motapothula, M.; Yi, J.B. ; Santoso, I. ; Feng, Y.P. ; Yang, K.; Dai, Y.; Yakovlev, N.L.; Ding, J. ; Wee, A.T.S. ; Neuber, G.; Breese, M.B.H. ; Ruebhausen, M.; Hilgenkamp, H.; Venkatesan, T. 
524-Jan-2011Defect dynamics and spectral observation of twinning in single crystalline LaAlO3 under subbandgap excitationChen, J.Q.; Wang, X.; Lu, Y.H. ; Roy Barman, A.; You, G.J. ; Xing, G.C.; Sum, T.C.; Dhar, S. ; Feng, Y.P. ; Ariando ; Xu, Q.-H. ; Venkatesan, T. 
62006Dual metal gates with band-edge work functions on novel HfLaO high- κ gate dielectricWang, X.P.; Shen, C.; Li, M.-F. ; Yu, H.Y.; Sun, Y. ; Feng, Y.P. ; Lim, A.; Sik, H.W.; Chin, A.; Yeo, Y.C. ; Lo, P.; Kwong, D.L.
72011Electronic phase separation at the LaAlO3/SrTiO3 interfaceAriando ; Wang, X.; Baskaran, G.; Liu, Z.Q.; Huijben, J.; Yi, J.B. ; Annadi, A.; Barman, A.R.; Rusydi, A. ; Dhar, S. ; Feng, Y.P. ; Ding, J. ; Hilgenkamp, H.; Venkatesan, T. 
82009Erratum: Strain effects on work functions of pristine and potassium-decorated carbon nanotubes (Journal of Chemical Physics (2009) 131 (224701))Cai, Y. ; Zhang, A. ; Feng, Y.P. ; Zhang, C. ; Teoh, H.F.; Ho, G.W. 
92009Ferromagnetism in semiconductors doped with non-magnetic elementsFeng, Y.P. ; Pan, H. ; Wu, R.Q. ; Shen, L. ; Ding, J. ; Yi, J.B. ; Wu, Y.H. 
102005First principle study of Si and Ge band structure for UTB MOSFETs applicationsLow, T.; Feng, Y.P. ; Li, M.F. ; Samudra, G. ; Yeo, Y.C. ; Bai, P.; Chan, L.; Kwong, D.L.
11Sep-2007Graphene thickness determination using reflection and contrast spectroscopyNi, Z.H.; Wang, H.M.; Kasim, J.; Fan, H.M.; Yu, T.; Wu, Y.H. ; Feng, Y.P. ; Shen, Z.X.
129-Mar-2011Graphene-based spin caloritronicsZeng, M. ; Feng, Y. ; Liang, G. 
13Nov-2007High temperature Raman spectroscopy studies of carbon nanowallsNi, Z.H.; Fan, H.M. ; Fan, X.F.; Wang, H.M.; Zheng, Z.; Feng, Y.P. ; Wu, Y.H. ; Shen, Z.X.
14Feb-2009International Journal of Nanoscience: Guest editorialWee, A.T.S. ; Wan, A.C.A.; Feng, Y.P. ; Zhang, H.; Jalil, M.B.A. ; Valiyaveettil, S. 
157-May-2012Nanowelding of carbon nanotube-metal contacts: An effective way to control the Schottky barrier and performance of carbon nanotube based field effect transistorsNurbawono, A.; Zhang, A. ; Cai, Y. ; Wu, Y. ; Feng, Y.P. ; Zhang, C. 
162004Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETsShen, C.; Li, M.F. ; Wang, X.P.; Yu, H.Y. ; Feng, Y.P. ; Lim, A.T.-L. ; Yeo, Y.C. ; Chan, D.S.H. ; Kwong, D.L.
172005Negative- U property of oxygen vacancy in cubic Hf O 2Feng, Y.P. ; Lim, A.T.L. ; Li, M.F. 
182005Negative- U property of oxygen vacancy in cubic Hf O 2Feng, Y.P. ; Lim, A.T.L. ; Li, M.F. 
192005Negative- U property of oxygen vacancy in cubic Hf O 2Feng, Y.P. ; Lim, A.T.L. ; Li, M.F. 
202005New insights in hf based high-k gate dielectrics in mosfetsLi, M.-F. ; Zhu, C. ; Shen, C.; Yu, X.F.; Wang, X.P.; Feng, Y.P. ; Du, A.Y.; Yeo, Y.C. ; Samudra, G. ; Chin, A. ; Kwong, D.L.