Please use this identifier to cite or link to this item:
https://doi.org/10.1021/nl071254m
| Title: | Graphene thickness determination using reflection and contrast spectroscopy | Authors: | Ni, Z.H. Wang, H.M. Kasim, J. Fan, H.M. Yu, T. Wu, Y.H. Feng, Y.P. Shen, Z.X. |
Issue Date: | Sep-2007 | Citation: | Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X. (2007-09). Graphene thickness determination using reflection and contrast spectroscopy. Nano Letters 7 (9) : 2758-2763. ScholarBank@NUS Repository. https://doi.org/10.1021/nl071254m | Abstract: | We have clearly discriminated the single-, bilayer-, and multiple-layer graphene ( | Source Title: | Nano Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/82426 | ISSN: | 15306984 | DOI: | 10.1021/nl071254m |
| Appears in Collections: | Staff Publications |
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