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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Main Affiliation
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Results 121-140 of 169 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1212002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
21-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K. 
310-Aug-1993Quasi-static and high frequency C-V measurements on Al/Ta2O5/SiO2/SiSundaram, K.; Choi, W.K. ; Ling, C.H. 
420-Oct-2001Raman and photoluminescence characterization of Ge nanocrystals in co-sputtered Ge + SiO2 systemChoi, W.K ; Ng, V. ; Ho, Y.W; Ng, S.P; Chen, T.B; Yu, M.B; Rusli; Yoon, S.F; Cheong, B.A; Chen, G.L
5Aug-1999Raman characterization of germanium nanocrystals in amorphous silicon oxide films synthesized by rapid thermal annealingChoi, W.K. ; Ng, V. ; Ng, S.P.; Thio, H.H.; Shen, Z.X. ; Li, W.S. 
6Jan-2001Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structuresChim, W.K. ; Leong, K.K.; Choi, W.K. 
715-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
8Nov-2001Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin filmsNatarajan, A.; Bera, L.K. ; Choi, W.K. ; Osipowicz, T. ; Seng, H.L. 
915-Feb-2002Rapid thermal oxidation of radio frequency sputtered polycrystalline silicon germanium filmsChoi, W.K. ; Natarajan, A.; Bera, L.K. ; Wee, A.T.S. ; Liu, Y.J. 
101995Recombination lifetime in silicon from laser microwave photoconductance decay measurementLing, C.H. ; Teoh, H.K.; Choi, W.K. ; Zhou, T.Q. ; Ah, L.K.
112001RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ionsWang, S.J. ; Ong, C.K. ; Xu, S.Y. ; Chen, P. ; Chai, J.W.; Tjiu, W.C.; Pan, J.S.; Huan, A.C.H.; Feng, W.; Lim, J.S.; Yoo, W.J. ; Choi, W.K. 
124-Nov-2002Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structureTeo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.
53Dec-2001Spectroscopic ellipsometry and electrical studies of as-grown and rapid thermal oxidized Si1-x-yGexCy filmsChoi, W.K. ; Feng, W.; Bera, L.K. ; Yang, C.Y.; Mi, J.
14Mar-2004Stability and composition of Ni-germanosilicided Si 1-xGe x filmsPey, K.L.; Chattopadhyay, S.; Choi, W.K. ; Miron, Y.; Fitzgerald, E.A.; Antoniadis, D.A.; Osipowicz, T. 
152006Stress development of germanium nanocrystals in silicon oxide matrixChoi, W.K. ; Chew, H.G.; Zheng, F.; Chim, W.K.; Foo, Y.L.; Fitzgerald, E.A.
1626-Jun-2008Stress tuning of Ge nanocrystals embedded in dielectricsZheng, F.; Choi, W.K. ; Lin, F.; Tripathy, S.; Zhang, J.X. 
171-Apr-1998Structural and electrical characterisations of rapid thermal annealed thin silicon oxide films on siliconChan, Y.M.; Choo, C.K.; Choi, W.K. 
182001Structural and electrical characterizations of oxynitride films on solid phase epitaxially grown silicon carbideBera, L.K. ; Choi, W.K. ; McNeill, D.; Ray, S.K.; Chatterjee, S.; Maiti, C.K.
191995Structural and electrical studies of radio frequency sputtered hydrogenated amorphous silicon carbide filmsChoi, W.K. ; Loo, F.L.; Ling, C.H. ; Loh, F.C. ; Tan, K.L. 
20Nov-2001Structural characterisation of polycrystalline SiGe thin filmTeh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K.