| | Issue Date | Title | Author(s) |
| 1 | 20-Nov-2002 | C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloys | Feng, W.; Choi, W.K. ; Bera, L.K. ; Mi, J.; Yang, C.Y. |
| 2 | 10-Jul-2000 | Electrical properties of rapid thermal oxides on Si1-x-yGexCy films | Bera, L.K. ; Choi, W.K. ; Feng, W.; Yang, C.Y.; Mi, J. |
| 3 | Aug-2001 | High quality gate dielectrics grown by rapid thermal processing using split-N 2O technique on strained-Si 0.91Ge 0.09 films | Bera, L.K. ; Choi, W.K. ; Tan, C.S.; Samanta, S.K.; Maiti, C.K. |
| 4 | 1-Jan-2002 | Microstructural characterization of rf sputtered polycrystalline silicon germanium films | Choi, W.K. ; Teh, L.K.; Bera, L.K. ; Chim, W.K. ; Wee, A.T.S. ; Jie, Y.X. |
| 5 | Nov-2001 | N2O oxidation of strained-Si/relaxed-SiGe heterostructure grown by UHVCVD | Tan, C.S.; Choi, W.K. ; Bera, L.K. ; Pey, K.L. ; Antoniadis, D.A.; Fitzgerald, E.A.; Currie, M.T.; Maiti, C.K. |
| 6 | Dec-2001 | Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1-x-y GexCy films | Feng, W.; Choi, W.K. ; Bera, L.K. ; Ji, M.; Yang, C.Y. |
| 7 | Nov-2001 | Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin films | Natarajan, A.; Bera, L.K. ; Choi, W.K. ; Osipowicz, T. ; Seng, H.L. |
| 8 | 15-Feb-2002 | Rapid thermal oxidation of radio frequency sputtered polycrystalline silicon germanium films | Choi, W.K. ; Natarajan, A.; Bera, L.K. ; Wee, A.T.S. ; Liu, Y.J. |
| 9 | Dec-2001 | Spectroscopic ellipsometry and electrical studies of as-grown and rapid thermal oxidized Si1-x-yGexCy films | Choi, W.K. ; Feng, W.; Bera, L.K. ; Yang, C.Y.; Mi, J. |
| 10 | 2001 | Structural and electrical characterizations of oxynitride films on solid phase epitaxially grown silicon carbide | Bera, L.K. ; Choi, W.K. ; McNeill, D.; Ray, S.K.; Chatterjee, S.; Maiti, C.K. |
| 11 | Nov-2001 | Structural characterisation of polycrystalline SiGe thin film | Teh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K. |
| 12 | 1-Jan-2000 | Structural characterization of rapid thermal oxidized Si1-x-yGexCy alloy films grown by rapid thermal chemical vapor deposition | Choi, W.K. ; Chen, J.H. ; Bera, L.K. ; Feng, W.; Pey, K.L. ; Mi, J.; Yang, C.Y.; Ramam, A. ; Chua, S.J. ; Pan, J.S. ; Wee, A.T.S. ; Liu, R. |
| 13 | 1-Jun-2000 | Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy films | Choi, W.K. ; Bera, L.K. ; Chen, J.H. ; Feng, W.; Pey, K.L. ; Yoong, H.; Mi, J.; Zhang, F.; Yang, C.Y. |