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Wai Kin Chim

rp04472

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Full Name
Wai Kin Chim
Variants
CHIM, WAI KIN
Chim, W.-K.
CBIM, W. K.
CHIM, WAI K.
Chim, W.K.
KIN, CHIM WAI
Chim Wai Kin
 
Main Affiliation
 
Faculty
 
Email
elecwk@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1990 TO 1999]
Author:  Phang, J.C.H.

Results 1-20 of 24 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
1Jun-1993An energy dependent model for type I magnetic contrast in the scanning electron microscopeChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
21997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
31997Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structuresLiu, X.; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
41998Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiencyPhang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Liu, Y.Y.; Liu, X.
51996Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factorWittpahl, V.; Liu, Y.Y.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J.; Yan, K.P.
6Jul-1996Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devicesChan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. 
7Jun-1991Error voltage components in quantitative voltage contrast measurement systemsChan, D.S.H. ; Low, T.S. ; Chim, W.K. ; Phang, J.C.H. 
81998Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescenceLiu, X.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. 
91996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
101996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
111999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
121999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
133-Mar-1998Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mappingCHIM, WAI KIN ; CHAN, DANIEL SIU HUNG ; PHANG, JACOB CHEE HONG ; TAO, JING MEI ; LIU, YONG YU 
14Apr-1994Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysisChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. 
1523-Jan-1996Method and apparatus for measuring quantitative voltage contrastCHIM, WAI K. ; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
16Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
17Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
181997New method for the localization of metallization defects using cathodoluminescence imagingLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
191995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
201995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K.