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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Main Affiliation
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]
Type:  Conference Paper

Results 21-38 of 38 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
2120-Mar-2002Investigation on oxide growth mechanism of PECVD silicon carbide filmsChoi, W.K. ; Leoy, C.C.; Lee, L.P.
222002Length effects on the reliability of dual-damascene Cu interconnectsWei, F.; Gan, C.L.; Thompson, C.V.; Clement, J.J.; Hau-Riege, S.P.; Pey, K.L. ; Choi, W.K. ; Tay, H.L.; Yu, B.; Radhakrishnan, M.K.
232002Manipulation of germanium nanocrystals in a tri-layer insulator structure of a metal-insulator-semiconductor memory deviceTeo, L.W.; Heng, C.L. ; Ho, V.; Tay, M.; Choi, W.K. ; Chim, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.
242003Material and electrical characterization of HfO2 films for MIM capacitors applicationHu, H.; Zhu, C. ; Lu, Y.F. ; Wu, Y.H. ; Liew, T. ; Li, M.F. ; Cho, B.J. ; Choi, W.K. ; Yakovlev, N.
52004Mortality dependence of Cu dual damascene interconnects on adjacent segmentChang, C.W.; Gan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. ; Hwang, N.
62005Multi-via electromigration test structures for identification and characterization of different failure mechanismsChoi, Z.-S.; Chang, C.W.; Lee, J.H.; Gan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. 
720-Nov-2002Nickel silicidation on polycrystalline silicon germanium filmsChoi, W.K. ; Pey, K.L. ; Zhao, H.B.; Osipowicz, T. ; Shen, Z.X. 
8Dec-2001Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1-x-y GexCy filmsFeng, W.; Choi, W.K. ; Bera, L.K. ; Ji, M.; Yang, C.Y.
92001Oxidation study of hydrogenated amorphous silicon carbide filmsChoi, W.K. ; Lee, L.P.; Leoy, C.C.
1020-Nov-2002Oxidation study of rf sputtered amorphous and polycrstalline silicon germanium filmsLeoy, C.C.; Kan, E.W.H.; Arianto, J.; Choi, W.K. ; Wee, A.T.S. ; Liu, Y.J. 
112002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
122001Structural and electrical characterizations of oxynitride films on solid phase epitaxially grown silicon carbideBera, L.K. ; Choi, W.K. ; McNeill, D.; Ray, S.K.; Chatterjee, S.; Maiti, C.K.
132004Study of Ge out-diffusion during nickel (Platinum - 0, 5, 10 at.%) germanosilicide formationJin, L.J.; Pey, K.L.; Choi, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.; Pitera, A.J.; Lee, M.L.; Chi, D.Z.
142007Synthesis and electronic application of germanium nanocrystals in silicon oxide matrixChoi, W.K. ; Chim, W.K. ; Chew, H.G.
151-Aug-2004Synthesis of germanium nanodots on silicon using an anodic alumina membrane maskChen, Z.; Lei, Y.; Chew, H.G.; Teo, L.W.; Choi, W.K. ; Chim, W.K. 
16Apr-2000Synthesizing germanium nanocrystals in amorphous silicon oxide by rapid thermal annealingChoi, W.K. ; Thio, H.H.; Ng, S.P.; Ng, V. ; Cheong, B.A.
172002X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium filmsLeoy, C.C.; Choi, W.K. ; Wong, K.L. ; Wong, K.M. ; Osipowicz, T. ; Rong, J.
182002Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanismsNg, T.H.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.