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https://scholarbank.nus.edu.sg/handle/10635/21299
| Title: | X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films | Authors: | Leoy, C.C. Choi, W.K. Wong, K.L. Wong, K.M. Osipowicz, T. Rong, J. |
Issue Date: | 2002 | Citation: | Leoy, C.C.,Choi, W.K.,Wong, K.L.,Wong, K.M.,Osipowicz, T.,Rong, J. (2002). X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films. International Journal of Modern Physics B 16 (28-29) : 4263-4266. ScholarBank@NUS Repository. | Source Title: | International Journal of Modern Physics B | URI: | http://scholarbank.nus.edu.sg/handle/10635/21299 | ISSN: | 02179792 |
| Appears in Collections: | Staff Publications |
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