Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/21299
Title: X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
Authors: Leoy, C.C.
Choi, W.K. 
Wong, K.L. 
Wong, K.M. 
Osipowicz, T. 
Rong, J.
Issue Date: 2002
Source: Leoy, C.C.,Choi, W.K.,Wong, K.L.,Wong, K.M.,Osipowicz, T.,Rong, J. (2002). X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films. International Journal of Modern Physics B 16 (28-29) : 4263-4266. ScholarBank@NUS Repository.
Source Title: International Journal of Modern Physics B
URI: http://scholarbank.nus.edu.sg/handle/10635/21299
ISSN: 02179792
Appears in Collections:Staff Publications

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