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ELECTRICAL AND COMPUTER ENGINEERING

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ELECTRICAL AND COMPUTER ENGINEERING

Publications


Results 1261-1280 of 15308 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1261Feb-2007Temperature dependence of thermally activated ferromagnetic resonance in tunneling magnetoresistive headsHan, G.C.; Zong, B.Y.; Li, K.B.; Liu, B.; Wu, Y.H. ; Mao, S.N.
211-Mar-1996Temperature dependence of the low-field mobility of a very narrow miniband in the degenerate caseXu, S.J. ; Liu, J.; Zheng, H.Z.; Chua, S.J. ; Li, Y.X.; Cheng, W.C.; Zhang, P.H.; Yang, X.P.
325-Oct-2006Temperature dependence of Raman spectrum of GaNAs ternary alloys grown by molecular beam epitaxyLiu, H.F. ; Xiang, N. ; Tripathy, S.; Chua, S.J. 
42015Temperature dependence of photoluminescence spectra of bilayer two-dimensional electron gases in LaAlO3/SrTiO3 superlattices: Coexistence of Auger recombination and single-carrier trappingMa, H.J.H; Venkatesan, T ; Wang, S.J ; Ariando, NUSNNI-Nanocore, National University of Singapore117411, Singapore, Department of Physics, National University of Singapore117542, Singapore 
52007Temperature dependence of magnetotransport properties of Ni80 Fe20 Fe50 Mn50 Ni80 Fe20 trilayersChui, K.M.; Tripathy, D. ; Adeyeye, A.O. 
6Nov-2008Temperature dependence of carrier transport of a silicon nanowire schottky-barrier field-effect transistorYang, W.F.; Lee, S.J. ; Liang, G.C. ; Eswar, R.; Sun, Z.Q.; Kwong, D.L. 
72004Temperature control and in-situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Lim, K.W.
8Feb-2007Temperature control and in situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Zhou, Y.; Tan, W.W. ; Chen, M.
92014Temperature aware energy-reliability trade-offs for mapping of throughput-constrained applications on multimedia MPSoCsDas, A.; Kumar, A. ; Veeravalli, B.
1015-Apr-2021TempDiff: Temporal Difference-Based Feature Map-Level Sparsity Induction in CNNs with <4% Memory OverheadWATHUTHANTHRIGE UDARI CHARITHA DE ALWIS ; ALIOTO,MASSIMO BRUNO 
116-Jun-2021TempDiff: Temporal Difference-Based Feature Map-Level Sparsity Induction in CNNs with <4% Memory OverheadDe Alwis, Udari ; Alioto, Massimo Bruno 
1215-Nov-2021TempDiff: Feature Map-Level CNN Sparsity Enhancement at Near-Zero Memory Overhead via Temporal DifferenceWATHUTHANTHRIGE UDARI CHARITHA DE ALWIS ; Massimo Bruno Alioto 
13Aug-2012Telerobotic Pointing Gestures Shape Human Spatial CognitionCabibihan, J.-J. ; So, W.-C.; Saj, S.; Zhang, Z.
1421-Apr-2016Telemetry and Telecommand of VELOX-PII with Ground Communication in Near Urban EnvironmentGoh ; Low, K; Ye, C; Kamajaya, I
152012Tectonic evolution of the Sibumasu-Indochina terrane collision zone in Thailand and Malaysia: Constraints from new U-Pb zircon chronology of SE Asian tin granitoidsSearle, M.P.; Whitehouse, M.J.; Robb, L.J.; Ghani, A.A.; Hutchison, C.S.; Sone, M.; Ng, S.W.-P.; Roselee, M.H.; Chung, S.-L.; GRAHAME JOHN HENDERSON OLIVER 
162012Technology-independent table-based diode model for rectenna design in RF energy harvestingHe, M.; Sun, H.; Zhong, Z. ; Guo, Y.-X. ; Xia, M.
172013Technology options for reducing contact resistances in nanoscale metal-oxide-semiconductor field-effect transistorsYeo, Y.-C. 
182009Technology management educational initiatives in Asia: A case study from the national university of SingaporeHang, C.-C. ; Ang, M. ; Wong, P.-K. ; Subramanian, A. 
192014Technology licensing and innovation performance: evidence from Chinese latecomers in high-tech industriesZhao, Y.Y.; Wong, P.K. ; Subramanian, A.M. ; Hang, C.C. 
2023-Sep-2023Technology and Integration Roadmap for Optoelectronic MemristorJinyong Wang; Nasir Ilyas; Yujing Ren; Yun Ji ; Sifan Li ; Changcun Li; Fucai Liu; Deen Gu; Kah Wee Ang