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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1950 TO 1999]

Results 1-20 of 38 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Mar-1998A high resolution beam scanning system for deep ion beam lithographySanchez, J.L.; Van Kan, J.A. ; Osipowicz, T. ; Springham, S.V.; Watt, F. 
2Jul-1997A PIXE micro-tomography experiment using MLEM algorithmNg, Y.K.; Orlic, I. ; Liew, S.C. ; Loh, K.K. ; Tang, S.M. ; Osipowicz, T. ; Watt, F. 
32-Sep-1999Channeling contrast microscopy of GaN and InGaN thin filmsOsipowicz, T. ; Chiam, S.Y. ; Watt, F. ; Li, G.; Chua, S.J.
41997Deep ion beam lithography for micromachining applicationsSpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Lee, S.; Watt, F. 
51997Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysisOsipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
6Jun-1999Distribution of Ag in Ag-doped YBa2Cu3O7-δ thin film prepared by dual-beam pulsed-laser depositionZhou, W.Z.; Chua, D.H.C.; Xu, S.Y. ; Ong, C.K. ; Feng, Y.P. ; Osipowicz, T. ; Chen, M.S.
7Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
8Mar-1998Fluence dependence of IBIC collection efficiency of CMOS transistorsOsipowicz, T. ; Sanchez, J.L.; Orlic, I. ; Watt, F. ; Kolachina, S.; Chan, D.S.H. ; Phang, J.C.H. 
91999Formation and stability of Ni(Pt) silicide on(100)Si and (111)SiMangelinck, D.; Dai, J.Y.; Lahiri, S.K.; Ho, C.S.; Osipowicz, T. 
102-Sep-1999Hydrogen 3D distribution in solids by ERDA imagingYang, C. ; Teo, E.J. ; Osipowicz, T. ; Watt, F. ; Jamieson, D.; Lee, K.K.; Tomcik, B. 
111998Imaging of charge collection properties of CVD diamond using high-resolution ion beam induced charge technique with protons and alpha particlesJakšić, M.; Tadić, T.; Orlić, I. ; Osipowicz, T. ; Vittone, E.; Manfredotti, C.
121999Indium-doped zinc oxide films prepared by simultaneous r.f. and d.c. magnetron sputteringZhang, K.; Zhu, F. ; Huan, C.H.A. ; Wee, A.T.S. ; Osipowicz, T. 
132-Sep-1999Investigation of light emitting diodes using nuclear microprobesYang, C. ; Bettiol, A.; Jamieson, D.; Hua, X.; Phang, J.C.H. ; Chan, D.S.H. ; Watt, F. ; Osipowicz, T. 
141997Ion Beam Induced Charge imaging for the failure analysis of semiconductor devicesKolachina, S.; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Sanchez, J.L.; Watt, F. 
15Mar-1998L X-ray production cross sections of medium Z elements by 4He ion impactOrlić, I. ; Osipowicz, T. ; Sow, C.H. 
162-Mar-1994L X-ray production cross sections of medium Z elements for 0.4 to 2.0 MeV protonsSow, C.H. ; Orlic, I. ; Osipowicz, T. ; Tang, S.M. 
173-Apr-1993Measurement of phosphorus content in silica layersLoh, K.K. ; Sow, C.H. ; Tan, K.H. ; Tan, H.S. ; Tang, S.M. ; Orlic, I. ; Osipowicz, T. 
18Jul-1997Micro-PIXE analysis of trace element concentrations of natural rubies from different locations in MyanmarSanchez, J.L.; Osipowicz, T. ; Tang, S.M. ; Tay, T.S.; Win, T.T.
192-Apr-1999Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7-δ thin filmsOsipowicz, T. ; Xu, X.Y.; Yang, C. ; Zhou, W.Z.; Ong, C.K. ; Watt, F. 
20Jul-1997Micromachining using deep ion beam lithographySpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Gan, L.H.; Watt, F.