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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1950 TO 1999]

Results 21-38 of 38 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
211999Micromachining using focused high energy ion beams: Deep Ion Beam LithographyVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
2214-May-1998MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
2325-Aug-1999MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
24Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
25Mar-1998Nuclear microprobe analysis and imaging: Current state of the art performancesWatt, F. ; Osipowicz, T. ; Choo, T.F.; Orlic, I. ; Tang, S.M. 
262-Sep-1995Nuclear microscopy of rubies: trace elements and inclusionsOsipowicz, T. ; Tay, T.S.; Orlic, I. ; Tang, S.M. ; Watt, F. 
272-Sep-1999Proton micromachining of substrate scaffolds for cellular and tissue engineeringSanchez, J.L.; Guy, G. ; Van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
28Jul-1997Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBICOsipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
292-Mar-1994Reconstruction of Ar depth profiles from PIXE measurementsOsipowicz, T. ; Liew, S.C. ; Loh, K.K. ; Orlic, I. ; Tang, S.M. ; Weber, Th.
302-Sep-1999Resist materials for proton micromachiningVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
3127-Dec-1999Study of diffusion barrier properties of ionized metal plasma (IMP) deposited tantalum (Ta) between Cu and SiO2Lee, Y.K.; Maung Latt, K.; Jaehyung, K.; Osipowicz, T. ; Lee, K.
321-Sep-1996Surface and interface studies of titanium silicide formationWee, A.T.S. ; Huan, A.C.H. ; Osipowicz, T. ; Lee, K.K.; Thian, W.H.; Tan, K.L. ; Hogan, R.
332-Dec-1995Surface treatment by low energy metal ion irradiationWeber, T.; Verhoeven, J.; Saris, F.W.; Osipowicz, T. ; Münz, W.D.
342-Sep-1995The effect of external fields and slit scattering on the beam spot profile of the coupled triplet systemWatt, F. ; Choo, T.F.; Lee, K.K.; Osipowicz, T. ; Orlic, I. ; Tang, S.M. 
352-Sep-1995The microanalysis of individual aerosol particles using the nuclear microscopeOrlic, I. ; Osipowicz, T. ; Watt, F. ; Tang, S.M. 
362-Mar-1994The National University of Singapore nuclear microscope facilityWatt, F. ; Orlic, I. ; Loh, K.K. ; Sow, C.H. ; Thong, P. ; Liew, S.C. ; Osipowicz, T. ; Choo, T.F.; Tang, S.M. 
371999Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formationHo, C.S.; Pey, K.L. ; Tung, C.H.; Tee, K.C.; Prasad, K.; Saigal, D.; Tan, J.J.L.; Wong, H.; Lee, K.H.; Osipowicz, T. ; Chua, S.J. ; Karunasiri, R.P.G. 
381996Unconnected junction contrast in ion beam induced charge microscopyKolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.