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|Title:||Micro-PIXE analysis of trace element concentrations of natural rubies from different locations in Myanmar||Authors:||Sanchez, J.L.
|Issue Date:||Jul-1997||Citation:||Sanchez, J.L.,Osipowicz, T.,Tang, S.M.,Tay, T.S.,Win, T.T. (1997-07). Micro-PIXE analysis of trace element concentrations of natural rubies from different locations in Myanmar. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 130 (1-4) : 682-686. ScholarBank@NUS Repository.||Abstract:||The trace element concentrations found in geological samples can shed light on the formation process. In the case of gemstones, which might be of artificial or natural origin, there is also considerable interest in the development of methods that provide identification of the origin of a sample. For rubies, trace element concentrations present in natural samples were shown previously to be significant indicators of the region of origin [S.M. Tang et al., Appl. Spectr. 42 (1988) 44, and 43 (1989) 219]. Here we report the results of micro-PIXE analyses of trace element (Ti, V, Cr, Fe, Cu and Ga) concentrations of a large set (n = 130) of natural rough rubies from nine locations in Myanmar (Burma). The resulting concentrations are subjected to statistical analysis. Six of the nine groups form clusters when the data base is evaluated using tree clustering and principal component analysis. © 1997 Elsevier Science B.V.||Source Title:||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms||URI:||http://scholarbank.nus.edu.sg/handle/10635/97201||ISSN:||0168583X|
|Appears in Collections:||Staff Publications|
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