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Wai Kin Chim

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Full Name
Wai Kin Chim
Variants
CHIM, WAI KIN
Chim, W.-K.
CBIM, W. K.
CHIM, WAI K.
Chim, W.K.
KIN, CHIM WAI
Chim Wai Kin
 
Main Affiliation
 
Faculty
 
Email
elecwk@nus.edu.sg
 

Publications

Results 161-180 of 190 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1611-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K. 
162Jan-2001Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structuresChim, W.K. ; Leong, K.K.; Choi, W.K. 
16315-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
16415-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
16529-Oct-1996Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimensPHANG, J. C. H. ; CBIM, W. K. ; CHAN, D. S. H. ; LIU, Y. Y. 
16610-Jan-2011Role of oxygen for highly conducting and transparent gallium-doped zinc oxide electrode deposited at room temperatureWong, L.M.; Chiam, S.Y.; Huang, J.Q.; Wang, S.J.; Pan, J.S.; Chim, W.K. 
1672008Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sitesWong, K.M. ; Chim, W.K. ; Huang, J.Q.; Zhu, L.
168Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
1691999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
1708-Feb-2005Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masksLei, Y. ; Chim, W.-K. 
1714-Nov-2002Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structureTeo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.
1722007Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurementsWong, K.M. ; Chim, W.K. ; Ang, K.W.; Yeo, Y.C. 
17314-May-1996Spectroscopic observations of photon emissions in n-MOSFETs in the saturation regionTao, J.M. ; Chan, D.S.H. ; Chim, W.K. 
174Jun-1997Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line techniqueTeh, G.L.; Chim, W.K. ; Swee, Y.K.; Co, Y.K.
175Jun-1997Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line techniqueTeh, G.L.; Chim, W.K. ; Swee, Y.K.; Co, Y.K.
1761999Stress-induced leakage current and lateral nonuniform charge generation in thermal oxides subjected to negative-gate-voltage impulse stressingLim, P.S.; Chim, W.K. 
1772001Stress-induced leakage current in thin oxides under high-field impulse stressingTan, Y.N.; Chim, W.K. ; Lim, P.S.
178Nov-2001Structural characterisation of polycrystalline SiGe thin filmTeh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K. 
1792000Study of implanted boron distribution in p+n structures using scanning capacitance microscopyTeo, Y.L.; Pey, K.L. ; Chim, W.K. ; Chong, Y.F.
1801999Study on LED degradation using CL, EBIC and a two-diode parameter extraction modelXiao, H.; Liu, Y.Y.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Yan, K.P.