Full Name
Frank Watt
(not current staff)
Variants
Watt, F.
Frank, W.
WATT, FRANK
FRANK WATT
 
Main Affiliation
 
 
Email
phywattf@nus.edu.sg
 
 

Refined By:
Author:  Watt, F.

Results 121-140 of 257 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
121Jul-2001Iron concentrations and distributions in the parkinsonian substantia nigra of aged and young primate modelsRen, M.Q ; Xie, J.P ; Wang, X.S; Ong, W.Y; Leong, S.K; Watt, F. 
1221996Lattice substitution of phosphorous in diamond by Mev ion implantation and pulsed laser annealingPrawer, S.; Jamieson, D.N.; Walker, R.J.; Lee, K.K.; Watt, F. ; Kalish, R.
123Jan-2004Lithography of high spatial density biosensor structures with sub-100 nm spacing by MeV proton beam writing with minimal proximity effectWhitlow, H.J.; Ng, M.L.; Auzelyte, V.; Maximov, I.; Montelius, L.; Van Kan, J.A. ; Bettiol, A.A. ; Watt, F. 
124Apr-2005Measurement of cell motility on proton beam micromachined 3D scaffoldsZhang, F. ; Sun, F. ; Van Kan, J.A. ; Shao, P.G. ; Zheng, Z.; Ge, R.W. ; Watt, F. 
125Feb-2001Metal-containing amorphous carbon film development using electron cyclotron resonance CVDRusli, H.; Yoon, S.F.; Huang, Q.F.; Ahn, J.; Zhang, Q.; Yang, H.; Wu, Y.S.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
1262-Apr-1999Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7-δ thin filmsOsipowicz, T. ; Xu, X.Y.; Yang, C. ; Zhou, W.Z.; Ong, C.K. ; Watt, F. 
127Jul-2001Micro-RBS study of nickel silicide formationSeng, H.L. ; Osipowicz, T. ; Lee, P.S.; Mangelinck, D.; Sum, T.C. ; Watt, F. 
128Dec-2009Microfluidic sorting system based on optical force switchingHoi, S.-K. ; Udalagama, C. ; Sow, C.-H. ; Watt, F. ; Bettiol, A.A. 
1292001Micromachining using a focused MeV proton beam for the production of high precision 3D microstructures with vertical sidewalls of high orthogonalityVan Kan, J.A. ; Bettiol, A.A. ; Ansari, K. ; Watt, F. 
130Jul-1997Micromachining using deep ion beam lithographySpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Gan, L.H.; Watt, F. 
1311999Micromachining using focused high energy ion beams: Deep Ion Beam LithographyVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
13214-May-1998MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
13325-Aug-1999MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
13424-Sep-2002Micromachining using high energy light ionsWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
135Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
1365-Jan-2006Multicolor photoluminescence from porous silicon using focused, high-energy helium ionsTeo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Mangaiyarkarasi, D. ; Champeaux, F.; Watt, F. ; Blackwood, D.J. 
137Apr-2004Multiple-spot optical tweezers created with microlens arrays fabricated by proton beam writingSow, C.H. ; Bettiol, A.A. ; Lee, Y.Y.G.; Cheong, F.C. ; Lim, C.T. ; Watt, F. 
138Jul-2007Nano-imaging of single cells using STIMMinqin, R. ; van Kan, J.A. ; Bettiol, A.A. ; Daina, L.; Gek, C.Y.; Huat, B.B.; Whitlow, H.J.; Osipowicz, T. ; Watt, F. 
139Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
140Aug-2005New developments in the applications of proton beam writingMistry, P.; Gomez-Morilla, I.; Grime, G.W.; Webb, R.P.; Gwilliam, R.; Cansell, A.; Merchant, M.; Kirkby, K.J.; Teo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Blackwood, D.J. ; Watt, F.