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Pey Kin Leong

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Full Name
Pey Kin Leong
Variants
PEY, KIN-LEONG
PEY, KIN L.
LEONG, KIN
Pey, Kin Leong
PEY, KIN LEONG
Pey, K.L.
 
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Faculty
 

Publications

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Department:  ELECTRICAL AND COMPUTER ENGINEERING
Department:  PHYSICS

Results 41-60 of 73 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
4115-Feb-2011Method for forming a shallow junction region using defect engineering and laser annealingONG, KUANG KIAN; YEONG, SAI HOOI; PEY, KIN LEONG ; CHAN, LAP; CHONG, YUNG FU
4230-Jan-2001Method to fabricate a double-polysilicon gate structure for a sub-quarter micron self-aligned-titanium silicide processPEY, KIN-LEONG ; HO, CHAW SING; CHAN, LAP
431-Jan-2002Method to form MOS transistors with shallow junctions using laser annealingCHONG, YUNG FU; PEY, KIN LEONG ; SEE, ALEX ; WEE, ANDREW THYE SHEN 
444-Sep-2001Method to reduce compressive stress in the silicon substrate during silicidationCHA, RANDALL CHER LIANG; CHUA, CHEE TEE; PEY, KIN LEONG ; CHAN, LAP
45Mar-2000Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicidesLee, P.S.; Mangelinck, D.; Pey, K.L. ; Shen, Z.X. ; Ding, J. ; Osipowicz, T. ; See, A.
461995Microporous polymeric materials by microemulsion polymerization: Effect of surfactant concentrationChieng, T.H.; Gan, L.M. ; Chew, C.H. ; Lee, L.; Ng, S.C. ; Pey, K.L. ; Grant, D. 
47Oct-1996Microporous polymeric materials by microemulsion polymerization: Effect of the ratio of long and short alkyl chain length cationic surfactantsChieng, T.H.; Gan, L.M. ; Chew, C.H. ; Ng, S.C. ; Pey, K.L. 
48Jun-1996Microporous polymeric materials by polymerization of microemulsions containing different alkyl chain lengths of cationic surfactantsChieng, T.H.; Gan, L.M. ; Chew, C.H. ; Ng, S.C. ; Pey, K.L. 
4924-Jan-1996Microstructural control of porous polymeric materials via a microemulsion pathway using mixed nonpolymerizable and polymerizable anionic surfactantsChieng, T.H.; Gan, L.M. ; Chew, C.H. ; Ng, S.C. ; Pey, K.L. 
50Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
51Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
52Nov-2001N2O oxidation of strained-Si/relaxed-SiGe heterostructure grown by UHVCVDTan, C.S.; Choi, W.K. ; Bera, L.K. ; Pey, K.L. ; Antoniadis, D.A.; Fitzgerald, E.A.; Currie, M.T.; Maiti, C.K.
53Dec-2001New salicidation technology with Ni(Pt) alloy for MOSFETsLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Chi, D.Z.; Chan, L.
5420-Nov-2002Nickel silicidation on polycrystalline silicon germanium filmsChoi, W.K. ; Pey, K.L. ; Zhao, H.B.; Osipowicz, T. ; Shen, Z.X. 
55Dec-2001Nickel silicide formation on Si(100) and poly-Si with a presilicide N2 + implantationLee, P.S.; Mangelinck, D.; Pey, K.L. ; Ding, J. ; Chi, D.Z.; Dai, J.Y.; See, A. 
565-Jun-2000Nickel-platinum alloy monosilicidation-induced defects in n-type siliconChi, D.Z.; Mangelinck, D.; Dai, J.Y.; Lahiri, S.K.; Pey, K.L. ; Ho, C.S.
57Jul-1994Optoelectronic material analysis and device failure analysis using SEM cathodoluminescencePey, K.L. ; Chim, W.K. ; Phang, J.C.H. ; Chan, D.S.H. 
58Jun-2002Phase and layer stability of Ni- and Ni(Pt)-silicides on narrow poly-Si linesLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Chi, D.Z.; Dai, J.Y.; Chan, L.
592002Physical analysis of Ti-migration in 33 Å gate oxide breakdownPey, K.L. ; Tung, C.H. ; Lin, W.H.; Radhakrishnan, M.K. 
60May-2003Reduction of carrier depletion in p+ polysilicon gates using laser thermal processingChong, Y.F.; Gossmann, H.-J.L.; Thompson, M.O.; Pey, K.L. ; Wee, A.T.S. ; Talwar, S.; Chan, L.