1. ScholarBank@NUS

Thye Shen, Andrew Wee

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Full Name
Thye Shen, Andrew Wee
Variants
Wee, A.T.
Wee, A.T.S.
Wee A.T.S.
Thye Shen Wee, A.
Wee, A.T.S
Thye-Shen Wee, A.
Wee A.T.S
Wee, S.
Wee, A.T.-S.
Wee, A.T.A.
WEE, ANDREW THYE SHEN
Wee, T.S.
Wee, A.
Wee, Andrew T.S.
Wee, T.S.A.
Wee Thye Shen, Andrew
 
Main Affiliation
 
Faculty
 
Email
phyweets@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2023]

Results 381-400 of 491 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
3815-Dec-2005Structure of Co deposited 6H-SiC(0 0 0 1)Chen, W. ; Xu, H. ; Loh, K.P. ; Wee, A.T.S. 
3821-Dec-2003Structure of Fe(3 1 0) studied by quantitative LEED analysis and pseudopotential DFT calculationsSun, Y.Y. ; Xu, H. ; Feng, Y.P. ; Huan, A.C.H. ; Wee, A.T.S. 
3832020Structuring Nonlinear Wavefront Emitted from Monolayer Transition-Metal DichalcogenidesHong, X.; Hu, G. ; Hu, G.; Zhao, W.; Wang, K.; Sun, S. ; Zhu, R. ; Zhu, R. ; Wu, J.; Liu, W.; Loh, K.P. ; Wee, A.T.S. ; Wee, A.T.S. ; Wang, B.; AlÃ, A.; Qiu, C.-W. ; Lu, P.; Lu, P.
384Apr-2003Study of a computational-time-saving scheme for quantitative LEED analysis by the matrix inversion methodSun, Y.Y. ; Wee, A.T.S. ; Huan, A.C.H. 
385Sep-2004Study of copper diffusion into Ta and TaN barrier materials for MOS devicesLoh, S.W.; Zhang, D.H.; Li, C.Y.; Liu, R. ; Wee, A.T.S. 
38620-Jan-2002Study of copper diffusion into tantalum and tantalum diffusion into copperLoh, S.W.; Zhang, D.H.; Li, C.Y.; Liu, R. ; Wee, A.T.S. 
3872002Study of copper diffusion into tantalum nitride (Ta2N) by rapid thermal annealing (RTA)Loh, S.W.; Zhang, D.H.; Liu, R. ; Li, C.Y.; Wee, A.T.S. 
388Oct-2001Study of copper suicide retardation effects on copper diffusion in siliconLee, C.S.; Gong, H. ; Liu, R. ; Wee, A.T.S. ; Cha, C.L.; See, A.; Chan, L.
3892001Study of Cu diffusion in Cu/Tan/SiO2/Si multilayer structuresZhang, D.H.; Loh, S.W.; Li, C.Y.; Foo, P.D.; Xie, J.; Liu, R. ; Wee, A.T.S. ; Zhang, L.; Lee, Y.K.
3907-May-2012Study of electromagnetic enhancement for surface enhanced Raman spectroscopy of SiC grapheneNiu, J.; Truong, V.G.; Huang, H. ; Tripathy, S.; Qiu, C.; Wee, A.T.S. ; Yu, T. ; Yang, H. 
391Mar-2001Study of electronic properties and bonding configuration at the BN/SiC interfaceWang, H.-Q. ; Zheng, J.-C. ; Wee, A.T.S. ; Huan, C.H.A. 
3922007Study of ion-implanted in Sb1-xNx alloys using secondary ion mass spectroscopyWang, Y.; Zhang, D.H.; Huang, Z.M.; Liu, W.; Li, J.H.; Liu, C.J. ; Wee, A.T.S. 
3932001Study of the morphological modifications induced by laser annealing of preamorphized siliconChong, Y.F.; Pey, K.L. ; Lu, Y.F. ; Wee, A.T.S. ; See, A.
39415-Jun-2004Sub-keV secondary ion mass spectrometry depth profiling: Comparison of sample rotation and oxygen floodingLiu, R. ; Wee, A.T.S. 
395Jan-2002Substrate temperature studies of SrBi2(Ta1-xNbx)2O9 grown by pulsed laser ablation depositionTay, S.T.; Huan, C.H.A. ; Wee, A.T.S. ; Liu, R. ; Goh, W.C. ; Ong, C.K. ; Chen, G.S.
3963-Oct-2011Substrate-mediated electron tunneling through molecule-electrode interfacesSun, J.-T. ; Chen, L.; Ping Feng, Y. ; Thye Shen Wee, A. 
3972018Surface Nanostructure Formation and Atomic-Scale Templates for NanodevicesCui, X. ; Troadec, C.; Wee, A.T.S. ; Huang, Y.L. 
3987-May-2008Surface phase transition of Cu/Si(1 1 1)-(5 × 5) by scanning tunnelling microscopy and photoemission studyZhang, Y.P. ; Yong, K.S.; Chan, H.S.O. ; Xu, G.Q. ; Gao, X.Y. ; Qi, D.C. ; Wang, X.S. ; Wee, A.T.S. 
3995-Feb-2004Surface properties of miscible poly(1,1,1,3,3,3-hexafluoroisopropyl methacrylate)/phenoxy blendsHuang, H.L.; Goh, S.H. ; Lai, D.M.Y.; Huan, C.H.A. ; Wee, A.T.S. 
4002001Surface Review and Letter: PrefaceLoh, K.-P. ; Sim, W.-S. ; Tsong, T.T.; Wee, A.T.S.