ELECTRICAL AND COMPUTER ENGINEERING

Organization name
ELECTRICAL AND COMPUTER ENGINEERING


Results 2301-2320 of 15308 (Search time: 0.008 seconds).

Issue DateTitleAuthor(s)
23012010Silicon nanowires thermoelectric devicesLi, Y.; Buddharaju, K.; Singh, N.; Lo, G.Q.; Lee, S.J. 
2Sep-2011Silicon nanowire forthermoelectric applications: Effects of contact resistanceLi, Y.; Buddharaju, K.; Singh, N.; Lo, G.Q.; Lee, S.J. 
32003Silicon Nanostructured Films Formed by Pulsed-Laser Deposition in Inert Gas and Reactive GasChen, X.Y.; Lu, Y.F. ; Wu, Y.H. ; Cho, B.J. ; Hu, H.
42007Silicon nano-wire impact ionization transistors with multiple-gates for enhanced gate control and performanceToh, E.-H.; Wang, G.H.; Shen, C.; Zhu, M. ; Chan, L.; Heng, C.-H. ; Samudra, G. ; Yeo, Y.-C. 
5Jan-2010Silicon modulators and germanium photodetectors on SOI: Monolithic integration, compatibility, and performance optimizationLiow, T.-Y.; Ang, K.-W.; Fang, Q.; Song, J.-F.; Xiong, Y.-Z.; Yu, M.-B.; Lo, G.-Q.; Kwong, D.-L. 
62008Silicon beam structures comprising nanophotonics as NEMS sensorsLee, C. ; Thillaigovindan, J.; Radhakrishnan, R.; Li, J.; Balasubramanian, N.
72010Silicides as new electrode/heater for compact integration of phase change memory with CMOSFang, L.W.-W.; Zhao, R.; Yeo, E.-G.; Lim, K.-G.; Yang, H.; Shi, L.; Chong, T.-C. ; Yeo, Y.-C. 
82011Silicidation using nickel and Dysprosium stack on Si(100): NiSi 2 formation and impact on Schottky Barrier HeightLim, P.S.Y.; Zhou, Q. ; Chi, D.; Yeo, Y.-C. 
92009Silane-ammonia surface passivation for gallium arsenide surface-channel n-MOSFETsChin, H.-C.; Zhu, M. ; Liu, X.; Lee, H.-K.; Shi, L.; Tan, L.-S. ; Yeo, Y.-C. 
10May-2010Silane and ammonia surface passivation technology for high-mobility In 0.53Ga0.47As MOSFETsChin, H.-C.; Liu, X.; Gong, X.; Yeo, Y.-C. 
11May-2008Signing Exact English (SEE): Modeling and recognitionKong, W.W.; Ranganath, S. 
1228-Nov-2019Significance of Subband Features for Synthetic Speech DetectionYANG JICHEN ; ROHAN KUMAR DAS ; LI HAIZHOU 
1321-Apr-2022Significance of activation functions in developing an online classifier for semiconductor defect detectionMd Meftahul Ferdaus; Bangjian Zhou; Ji Wei Yoon; Kain Lu Low ; Jieming Pan ; Joydeep Ghosh ; Min Wu; Xiaoli Li; Aaron Voon-Yew Thean ; J. Senthilnath
141999Signed power-of-two term allocation scheme for the design of digital filtersLim, Y.C. ; Yang, R.; Li, D.; Song, J.
151998Signed power-of-two (SPT) term allocation scheme for the design of digital filtersLim, Yong-Ching ; Yang, Rui ; Li, Dongning ; Song, Jianjian 
161-Feb-2010Signed chromatic dispersion monitoring of lOOGbit/s CS-RZ DQPSK signal by evaluating the asymmetry ratio of delay tap samplingLi, Z.; Jian, Z.; Cheng, L.; Yang, Y.; Lu, C.; Lau, A.P.T.; Yu, C. ; Tam, H.Y.; Wai, P.K.A.
172016Signatures of the Adler-Bell-Jackiw chiral anomaly in a Weyl fermion semimetalZhang, C.-L; Xu, S.-Y; Belopolski, I; Yuan, Z; Lin, Z; Tong, B; Bian, G; Alidoust, N; Lee, C.-C ; Huang, S.-M; Chang, T.-R; Chang, G; Hsu, C.-H ; Jeng, H.-T; Neupane, M; Sanchez, D.S; Zheng, H; Wang, J; Lin, H ; Zhang, C; Lu, H.-Z; Shen, S.-Q; Neupert, T; Hasan, M.Z; Jia, S
1816-Jan-2018Signatures of electronic nematicity in (111) LaAlO3/SrTiO3 interfacesDavis, S.; Huang, Z. ; Han, K. ; Ariando ; Venkatesan, T. ; Chandrasekhar, V.
192012Signature voltage identification technique for implementation of a reliable autonomous-micro-grid systemDasgupta, S.; Mohan, S.N.; Sahoo, S.K. ; Panda, S.K. 
20Aug-2008Signal-subspace method approach to the intensity-only electromagnetic inverse scattering problemChen, X.