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ELECTRICAL AND COMPUTER ENGINEERING
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ELECTRICAL AND COMPUTER ENGINEERING
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Results 2301-2320 of 15308 (Search time: 0.008 seconds).
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Issue Date
Title
Author(s)
2301
2010
Silicon nanowires thermoelectric devices
Li, Y.
;
Buddharaju, K.
;
Singh, N.
;
Lo, G.Q.
;
Lee, S.J.
2
Sep-2011
Silicon nanowire forthermoelectric applications: Effects of contact resistance
Li, Y.
;
Buddharaju, K.
;
Singh, N.
;
Lo, G.Q.
;
Lee, S.J.
3
2003
Silicon Nanostructured Films Formed by Pulsed-Laser Deposition in Inert Gas and Reactive Gas
Chen, X.Y.
;
Lu, Y.F.
;
Wu, Y.H.
;
Cho, B.J.
;
Hu, H.
4
2007
Silicon nano-wire impact ionization transistors with multiple-gates for enhanced gate control and performance
Toh, E.-H.
;
Wang, G.H.
;
Shen, C.
;
Zhu, M.
;
Chan, L.
;
Heng, C.-H.
;
Samudra, G.
;
Yeo, Y.-C.
5
Jan-2010
Silicon modulators and germanium photodetectors on SOI: Monolithic integration, compatibility, and performance optimization
Liow, T.-Y.
;
Ang, K.-W.
;
Fang, Q.
;
Song, J.-F.
;
Xiong, Y.-Z.
;
Yu, M.-B.
;
Lo, G.-Q.
;
Kwong, D.-L.
6
2008
Silicon beam structures comprising nanophotonics as NEMS sensors
Lee, C.
;
Thillaigovindan, J.
;
Radhakrishnan, R.
;
Li, J.
;
Balasubramanian, N.
7
2010
Silicides as new electrode/heater for compact integration of phase change memory with CMOS
Fang, L.W.-W.
;
Zhao, R.
;
Yeo, E.-G.
;
Lim, K.-G.
;
Yang, H.
;
Shi, L.
;
Chong, T.-C.
;
Yeo, Y.-C.
8
2011
Silicidation using nickel and Dysprosium stack on Si(100): NiSi 2 formation and impact on Schottky Barrier Height
Lim, P.S.Y.
;
Zhou, Q.
;
Chi, D.
;
Yeo, Y.-C.
9
2009
Silane-ammonia surface passivation for gallium arsenide surface-channel n-MOSFETs
Chin, H.-C.
;
Zhu, M.
;
Liu, X.
;
Lee, H.-K.
;
Shi, L.
;
Tan, L.-S.
;
Yeo, Y.-C.
10
May-2010
Silane and ammonia surface passivation technology for high-mobility In 0.53Ga0.47As MOSFETs
Chin, H.-C.
;
Liu, X.
;
Gong, X.
;
Yeo, Y.-C.
11
May-2008
Signing Exact English (SEE): Modeling and recognition
Kong, W.W.
;
Ranganath, S.
12
28-Nov-2019
Significance of Subband Features for Synthetic Speech Detection
YANG JICHEN
;
ROHAN KUMAR DAS
;
LI HAIZHOU
13
21-Apr-2022
Significance of activation functions in developing an online classifier for semiconductor defect detection
Md Meftahul Ferdaus
;
Bangjian Zhou
;
Ji Wei Yoon
;
Kain Lu Low
;
Jieming Pan
;
Joydeep Ghosh
;
Min Wu
;
Xiaoli Li
;
Aaron Voon-Yew Thean
;
J. Senthilnath
14
1999
Signed power-of-two term allocation scheme for the design of digital filters
Lim, Y.C.
;
Yang, R.
;
Li, D.
;
Song, J.
15
1998
Signed power-of-two (SPT) term allocation scheme for the design of digital filters
Lim, Yong-Ching
;
Yang, Rui
;
Li, Dongning
;
Song, Jianjian
16
1-Feb-2010
Signed chromatic dispersion monitoring of lOOGbit/s CS-RZ DQPSK signal by evaluating the asymmetry ratio of delay tap sampling
Li, Z.
;
Jian, Z.
;
Cheng, L.
;
Yang, Y.
;
Lu, C.
;
Lau, A.P.T.
;
Yu, C.
;
Tam, H.Y.
;
Wai, P.K.A.
17
2016
Signatures of the Adler-Bell-Jackiw chiral anomaly in a Weyl fermion semimetal
Zhang, C.-L
;
Xu, S.-Y
;
Belopolski, I
;
Yuan, Z
;
Lin, Z
;
Tong, B
;
Bian, G
;
Alidoust, N
;
Lee, C.-C
;
Huang, S.-M
;
Chang, T.-R
;
Chang, G
;
Hsu, C.-H
;
Jeng, H.-T
;
Neupane, M
;
Sanchez, D.S
;
Zheng, H
;
Wang, J
;
Lin, H
;
Zhang, C
;
Lu, H.-Z
;
Shen, S.-Q
;
Neupert, T
;
Hasan, M.Z
;
Jia, S
18
16-Jan-2018
Signatures of electronic nematicity in (111) LaAlO3/SrTiO3 interfaces
Davis, S.
;
Huang, Z.
;
Han, K.
;
Ariando
;
Venkatesan, T.
;
Chandrasekhar, V.
19
2012
Signature voltage identification technique for implementation of a reliable autonomous-micro-grid system
Dasgupta, S.
;
Mohan, S.N.
;
Sahoo, S.K.
;
Panda, S.K.
20
Aug-2008
Signal-subspace method approach to the intensity-only electromagnetic inverse scattering problem
Chen, X.
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