ELECTRICAL AND COMPUTER ENGINEERING

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	Issue Date	Title	Author(s)
2181	1-Jan-2021	Single-Image Camera Response Function Using Prediction Consistency and Gradual Refinement	Sharma, A ; Tan, RT ; Cheong, LF
2182	2005	Single spin-fet for programmable logic gates	Tan, S.G.; Jalil, M.B.A. ; Kumar, B.; Teo, K.L. ; Liew, T.; Chong, T.C.
2183	2009	Single silicide comprising nickel-dysprosium alloy for integration in p- and n-FinFETs with independent control of contact resistance by aluminum implant	Sinha, M.; Lee, R.T.P. ; Devi, S.N.; Lo, G.-Q.; Eng, F.C. ; Yeo, Y.-C.
2184	1997	Single phase two-switch buck type AC-DC converter topology with inductor voltage control	Srinivasan, Ramesh; Palaniapan, Moorthi ; Oruganti, Ramesh
5	Dec-1997	Single phase power factor correction - A review	Oruganti, R. ; Srinivasan, R.
6	1995	Single phase parallel power processing scheme with power factor control	Srinivasan, Ramesh; Oruganti, Ramesh
7	1997	Single phase parallel power processing scheme with input-shunt power factor correction stage	Srinivasan, Ramesh; Oruganti, Ramesh
8	2012	Single mode photonic crystal vertical cavity surface emitting lasers	Choquette, K.D.; Siriani, D.F.; Kasten, A.M.; Tan, M.P.; Sulkin, J.D.; Leisher, P.O.; Raftery, J.J.; Danner, A.J.
9	2013	Single intersection signal control based on Type-2 fuzzy logic	Bi, Y.; Srinivasan, D. ; Lu, X.; Sun, Z.
10	1-Dec-2008	Single image tree modeling	Tan, P. ; Fang, T.; Xiao, J.; Zhao, P.; Quan, L.
11	2017	Single Image Deraining using Scale-Aware Multi-Stage Recurrent Network	Li, Ruoteng ; Cheong, Loong-Fah ; Tan, Robby T
12	10-Nov-2011	Single gradientless light beam drags particles as tractor beams	Novitsky, A.; Qiu, C.-W. ; Wang, H.
13	19-Feb-1998	Single FET loaded-line phase shifter configuration	Raghu Kumar, S.; Leong, M.S. ; Kooi, P.S.
14	28-Aug-2013	Single ferromagnetic layer magnetic random access memory	Xing, M.-J.; Jalil, M.B.A. ; Ghee Tan, S.; Jiang, Y.
15	25-Jan-2006	Single domain structure and two-color holographic recording in LiNbO 3:Cu:Ce crystals grown by the vertical Bridgman method	Liang, X.; Xu, X.; Chong, T.-C. ; Li, M.; Solanki, S.
16	2000	Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique	Chin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
17	Aug-2001	Single contact optical beam induced currents	Chin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M.; Gilfeather, G.; Soh, C.E.
18	Jun-1998	Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model	Kolachina, S.; Phang, J.C.H. ; Chan, D.S.H.
19	2013	Single contact electron beam induced current technique for solar cell characterization	Meng, L.; Street, A.G.; Phang, J.C.H. ; Bhatia, C.S.
20	Sep-2003	Single contact beam induced current phenomenon for microelectronic failure analysis	Phang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.