Full Name
Huan Cheng Hon,Alfred
(not current staff)
Variants
Huan, Cha
Huan, A.H.
Huan, C.H.A.
Huan, A.C.H.
Huan, C.H.
Huan, Alfred C.H.
Alfred, C.H.H.
Huan, C.-H.A.
Huan, A.
 
Main Affiliation
 
Faculty
 
Email
phyhuana@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]

Results 1-20 of 75 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
114-Mar-2005Al2O3-incorporation effect on the band structure of Ba0.5Sr0.5TiO3 thin filmsZheng, Y.B.; Wang, S.J.; Huan, A.C.H. ; Tan, C.Y. ; Yan, L. ; Ong, C.K. 
2Apr-2004Atomic-scale structure of the fivefold surface of an AlPdMn quasicrystal: A quantitative x-ray photoelectron diffraction analysisZheng, J.-C. ; Huan, C.H.A. ; Wee, A.T.S. ; Van Hove, M.A.; Fadley, C.S.; Shi, F.J.; Rotenberg, E.; Barman, S.R.; Paggel, J.J.; Horn, K.; Ebert, Ph.; Urban, K.
37-Jul-2000C60-containing polymer complexes: Complexation between multifunctional 1-(4-methyl)piperazinyl-fullerene or N-[(2-piperidyl)ethyl]aminofullerene and proton-donating polymersGoh, S.H. ; Lee, S.Y. ; Lu, Z.H.; Huan, C.H.A. 
4Aug-2002Characterization of fluoropolymer films deposited by magnetron sputtering of poly(tetrafluoroethylene) and plasma polymerization of heptadecafluoro-1-decene (HDFD) on (100)-oriented single-crystal silicon substratesZhang, Y. ; Yang, G.H.; Kang, E.T. ; Neoh, K.G. ; Huang, W. ; Huan, A.C.H. ; Lai, D.M.Y.
518-Jan-2000Complexation between hydrogensulfated fullerenol and poly(4-vinylpyridine)Huang, X.-D.; Goh, S.H. ; Lee, S.Y.; Huan, C.H.A. 
61-May-2000Composition and diffusion of nitrogenated carbon into the magnetic layerTomcik, B.; Osipowicz, T. ; Huan, C.H. 
721-Sep-2001Controlled synthesis of aligned carbon nanotube arrays on catalyst patterned silicon substrates by plasma-enhanced chemical vapor depositionWang, H. ; Lin, J. ; Huan, C.H.A. ; Dong, P.; He, J. ; Tang, S.H. ; Eng, W.K.; Thong, T.L.J. 
86-Aug-2002Deposition of fluoropolymer films on Si(100) surfaces by Rf magnetron sputtering of poly(tetrafluoroethylene)Zhang, Y. ; Yang, G.H.; Kang, E.T. ; Neoh, K.G. ; Huang, W. ; Huan, A.C.H. ; Wu, S.Y.
911-Dec-2000Dynamics of optical nonlinearity of Ge nanocrystals in a silica matrixJie, Y.X. ; Xiong, Y.N.; Wee, A.T.S. ; Huan, C.H.A. ; Ji, W. 
102000Effect of ITO carrier concentration on the performance of organic light-emitting diodesZhu, F.; Zhang, K.; Huan, C.H.A. ; Wee, A.T.S. ; Guenther, E.; Jin, C.S.
11May-2001Effects of oxygen flooding on crater bottom composition and roughness in ultrashallow secondary ion mass spectrometry depth profilingNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.
128-Nov-2004Energy-band alignments at ZrO2/Si, SiGe, and Ge interfacesWang, S.J.; Huan, A.C.H. ; Foo, Y.L.; Chai, J.W.; Pan, J.S.; Li, Q.; Dong, Y.F.; Feng, Y.P. ; Ong, C.K. 
132007Epitaxial oxides on semiconductors for application in nanoelectronicsWang, S.J.; Huan, A.C.H. 
1415-Jul-2005First-principles study of ZrO2 Si interfaces: Energetics and band offsetsDong, Y.F.; Feng, Y.P. ; Wang, S.J.; Huan, A.C.H. 
151-Mar-2004Growth of InAs quantum dots on shallow spherically shaped craters prepared on GaAs (0 0 1) substrates: An extended set of vicinal surfacesZheng, Y.B.; Chua, S.J. ; Huan, C.H.A. ; Miao, Z.L.
163-Mar-2005Growth of single-crystalline Ni and Co nanowires via electrochemical deposition and their magnetic propertiesPan, H. ; Liu, B. ; Yi, J. ; Poh, C. ; Lim, S.; Ding, J. ; Feng, Y. ; Huan, C.H.A. ; Lin, J. 
1715-Mar-2001High temperature annealing of hydrogenated amorphous silicon carbide thin filmsWang, Y.; Lin, J. ; Huan, C.H.A. ; Feng, Z.C.; Chua, S.J.
1828-Mar-2005Impact of interface structure on Schottky-barrier height for NiZr O2 (001) interfacesDong, Y.F.; Wang, S.J.; Chai, J.W.; Feng, Y.P. ; Huan, A.C.H. 
191-Nov-2000Indium tin oxide films prepared by radio frequency magnetron sputtering method at a low processing temperatureZhang, K.; Zhu, F.; Huan, C.H.A. ; Wee, A.T.S. 
2015-Nov-2000Influence of annealing temperature on ferroelectric properties of SrBi2Ta2O9 thin films prepared by off-axis radio frequency magnetron sputteringTay, S.T.; Jiang, X.H.; Huan, C.H.A. ; Wee, A.T.S. ; Liu, R.