1. ScholarBank@NUS

Osipowicz Thomas

rp05639

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 1-20 of 186 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
122-Jan-20032 MeV proton channeling contrast microscopy of LEO GaN thin film structuresOsipowicz, T. ; Teo, E.J. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
2Mar-1998A high resolution beam scanning system for deep ion beam lithographySanchez, J.L.; Van Kan, J.A. ; Osipowicz, T. ; Springham, S.V.; Watt, F. 
3Jul-2004A Monte Carlo simulation study of channelling and dechannelling enhancement due to lattice translationsRana, M.A.; Breese, M.B.H. ; Osipowicz, T. 
4Jul-1997A PIXE micro-tomography experiment using MLEM algorithmNg, Y.K.; Orlic, I. ; Liew, S.C. ; Loh, K.K. ; Tang, S.M. ; Osipowicz, T. ; Watt, F. 
52002A study of the decomposition of GaN during annealing over a wide range of temperaturesRana, M.A.; Choi, H.W.; Breese, M.B.H. ; Osipowicz, T. ; Chua, S.J. ; Watt, F. 
613-Oct-2003A study of the material loss and other processes involved during annealing of GaN at growth temperaturesRana, M.A.; Osipowicz, T. ; Choi, H.W.; Breese, M.B.H. ; Chua, S.J. 
7Apr-2005An automatic beam focusing system for MeV protonsUdalagama, C.N.B. ; Bettiol, A.A. ; Van Kan, J.A. ; Teo, E.J. ; Breese, M.B.H. ; Osipowicz, T. ; Watt, F. 
82005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
9Sep-2001Analysis of high-power devices using proton beam induced charge microscopyZmeck, M.; Phang, J. ; Bettiol, A. ; Osipowicz, T. ; Watt, F. ; Balk, L.; Niedernostheide, F.-J.; Schulze, H.-J.; Falck, E.; Barthelmess, R.
102000Analysis of high-power devices using proton beam induced currentsZmeck, M.; Osipowicz, T. ; Watt, F. ; Niedernostheide, F.; Schulze, H.-J.; Fiege, G.B.M.; Balk, L.
11Feb-2004Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometryMangelinck, D.; Lee, P.S.; Osipowitcz, T. ; Pey, K.L.
122005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
1315-Jun-2009Angular and lateral spreading of ion beams in biomedical nuclear microscopyWhitlow, H.J.; Ren, M. ; van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
142013Angular spreading measurements using MeV ion microscopesWhitlow, H.J.; Ren, M. ; Chen, X.; Osipowicz, T. ; Van Kan, J.A. ; Watt, F. 
15Sep-2004Ba0.1Sr0.9TiO3-BaTi4O 9 composite thin films with improved microwave dielectric propertiesYan, L. ; Chen, L.F. ; Tan, C.Y. ; Ong, C.K. ; Rahman, M.A.; Osipowicz, T. 
1615-May-2002Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2Maung Latt, K.; Park, H.S.; Li, S.; Rong, L. ; Osipowicz, T. ; Zhu, W.G.; Lee, Y.K.
17Jul-2007Channeling contrast microscopy of epitaxial lateral overgrowth of ZnO/GaN filmsZhou, H.; Pan, H. ; Chan, T.K. ; Ho, C.S.; Feng, Y. ; Chua, S.-J.; Osipowicz, T. 
182-Sep-1999Channeling contrast microscopy of GaN and InGaN thin filmsOsipowicz, T. ; Chiam, S.Y. ; Watt, F. ; Li, G.; Chua, S.J.
19Jul-2001Channeling contrast microscopy on lateral epitaxial overgrown GaNTeo, E.J. ; Osipowicz, T. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
2015-Jun-2009Characterisation of beam focus quality in biomedical nuclear microscopy: A Fourier optics approachWhitlow, H.J.; Ren, M. ; van Kan, J.A. ; Osipowicz, T. ; Watt, F.