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Teo Ee Jin

rp02428

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Profile

Full Name
Teo Ee Jin
(not current staff)
Variants
Teo, E.-J.
Teo, E.J.
 
Main Affiliation
 
Faculty
 
Email
phytej@nus.edu.sg
 

Publications

Results 1-20 of 40 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1Jul-2007A review of transmission channelling using high-demagnification microprobesBreese, M.B.H. ; Teo, E.J. ; Huang, L.
215-Jun-2009Advanced applications in microphotonics using proton beam writingBettiol, A.A. ; Chiam, S.Y. ; Teo, E.J. ; Udalagama, C. ; Chan, S.F.; Hoi, S.K. ; van Kan, J.A. ; Breese, M.B.H. ; Watt, F. 
326-Apr-2010An all-silicon, single-mode Bragg cladding rib waveguideTeo, E.J. ; Bettiol, A.A. ; Xiong, B.; Breese, M.B.H. ; Shuvan, P.T.
4Mar-2002Characteristics of nickel-containing carbon films deposited using electron cyclotron resonance CVDHuang, Q.F.; Yoon, S.F.; Rusli; Zhang, Q.; Ahn, J.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
52005Controlled shift in emission wavelength from patterned porous silicon using focused ion beam irradiationMangaiyarkarasi, D. ; Teo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Blackwood, D.J. 
6Jul-2002Deuterium-oxygen exchange on diamond (100)-A study by ERDA, RBS and TOF-SIMSLoh, K.P. ; Xie, X.N. ; Zhang, X. ; Teo, E.J. ; Osipowicz, T. ; Lai, M.Y.; Yakovlev, N.
7Jun-2001Effect of radio-frequency bias voltage on the optical and structural properties of hydrogenated amorphous silicon carbideCui, J.; Rusli; Yoon, S.F.; Teo, E.J. ; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Osipowicz, T. ; Watt, F. 
8Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
91-Mar-2001Effects of microwave power on the structural and emission properties of hydrogenated amorphous silicon carbide deposited by electron cyclotron resonance chemical vapor depositionCui, J.; Rusli, R.; Yoon, S.F.; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
1015-Oct-2009Effects of oxide formation around core circumference of silicon-on-oxidized-porous-silicon strip waveguidesTeo, E.J. ; Xiong, B.Q.; Ow, Y.S. ; Breese, M.B.H. ; Bettiol, A.A. 
11Jul-2007Embedded photonic structures fabricated in photosensitive glass using proton beam writingBettiol, A.A. ; Udalagama, C.N.B. ; Teo, E.J. ; van Kan, J.A. ; Watt, F. 
123-Sep-2004Enhanced planar channeling of MeV protons through thin crystalsBreese, M.B.H. ; Rana, M.A.; Osipowicz, T. ; Teo, E.J. 
132006Fabrication of buried channel waveguides in photosensitive glass using proton beam writingBettiol, A.A. ; Venugopal Rao, S.; Teo, E.J. ; Van Kan, J.A. ; Watt, F. 
141-Mar-2009Fabrication of low-loss silicon-on-oxidized-porous-silicon strip waveguide using focused proton-beam irradiationTeo, E.J. ; Bettiol, A.A. ; Yang, P.; Breese, M.B.H. ; Xiong, B.Q.; Mashanovich, G.Z.; Headley, W.R.; Reed, G.T.
15Aug-2006Fabrication of patterned porous silicon using high-energy ion irradiationTeo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Champeaux, F.J.T.; Watt, F. ; Blackwood, D.J. 
162007Freestanding waveguides in siliconYang, P.Y.; Mashanovich, G.Z.; Gomez-Morilla, I.; Headley, W.R.; Reed, G.T.; Teo, E.J. ; Blackwood, D.J. ; Breese, M.B.H. ; Bettiol, A.A. 
171-Apr-2002Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopyChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Zhang, Q.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
18Mar-2004High quality ion-induced secondary electron imaging for MeV nuclear microprobe applicationsTeo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Watt, F. ; Alves, L.C.
192006Hole transport through proton-irradiated p -type silicon wafers during electrochemical anodizationBreese, M.B.H. ; Champeaux, F.J.T.; Teo, E.J. ; Bettiol, A.A. ; Blackwood, D.J. 
202-Sep-1999Hydrogen 3D distribution in solids by ERDA imagingYang, C. ; Teo, E.J. ; Osipowicz, T. ; Watt, F. ; Jamieson, D.; Lee, K.K.; Tomcik, B.