ELECTRICAL AND COMPUTER ENGINEERING

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Results 2601-2620 of 15308 (Search time: 0.009 seconds).

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	Issue Date	Title	Author(s)
2601	2009	Scattering characteristics from conducting cylinder with reconstructing electromagnetic cloaking layers	Yao, H.-Y. ; Qiu, C.-W. ; Li, L.-W.
2602	13-Feb-2007	Scattering by rotationally symmetric anisotropic spheres: Potential formulation and parametric studies	Qiu, C.-W. ; Li, L.-W. ; Yeo, T.-S. ; Zouhdi, S.
2603	2003	Scattering by partially buried cylinders at the rough surface interface between two media	Wang, X. ; Gan, Y.-B. ; Li, L.-W.
2604	2000	Scattering by an arbitrarily shaped rotationally uniaxial anisotropic object: Electromagnetic fields and dyadic Green's functions	Liu, S.; Li, L.W. ; Leong, M.S. ; Yeo, T.S.
2605	2000	Scattering by an arbitrarily shaped rotationally uniaxial anisotropic object: Electromagnetic fields and dyadic green's fucntions	Liu, S.; Li, L.W. ; Leong, M.S. ; Yeo, T.S.
2606	2003	Scattering by a gyrotropic bianisotropic cylinder of arbitrary cross section: An analysis using generalized multipole technique	Zhang, M. ; Li, L.W. ; Yeo, T.S. ; Leong, M.S.
2607	2012	SCAR: A dynamic Coding-Aware Routing protocol	Wang, J.; Zhu, C.; Guo, Q.; Yoong, C.T.; Wong, W.-C.
2608	2014	SCAR: A coding-aware routing protocol with self-recommendation in static wireless ad hoc networks	Wang J.; Zhu C.; Chai T.Y.; Wong W.-C.
2609	2015	Scanning-free BOTDA based on ultra-fine digital optical frequency comb	Jin C.; Guo N.; Feng Y.; Wang L.; Liang H.; Li J.; Li Z.; Yu C. ; Lu C.
2610	Apr-2000	Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces	Lu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K.
11	30-Jun-2009	Scanning tunneling microscopy investigation of growth of self-assembled indium and aluminum nanostructures on inert substrates	Kushvaha, S.S. ; Xu, H. ; Xiao, W. ; Zhang, H.L. ; Wee, A.T.S. ; Wang, X.-S.
12	Oct-2000	Scanning tunneling microscopy and atomic force microscopy studies of laser irradiation of amorphous WO3 thin films	Qiu, H.; Lu, Y.-F.
13	Nov-1997	Scanning thermal microscopy and atomic force microscopy studies of laser-induced deposited metal lines	Zhou, L. ; Xu, G.Q. ; Li, S.F.Y. ; Ho, P.K.H. ; Zhang, P.C.; Ye, K.D. ; Wang, W.J. ; Lu, Y.F.
14	Oct-2001	Scanning face models with desktop cameras	Sengupta, K. ; Ko, C.C.
15	5-Jul-2004	Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes	Nojeh, A.; Wong, W.-K. ; Baum, A.W.; Pease, R.F.; Dai, H.
16	Mar-1996	Scanning electron microscope design for quantitative multicontrast	Khursheed, A.
17	13-Nov-2007	Scanning electron microscope	KHURSHEED, ANJAM
18	2000	Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation	Wong, W.K.; Yin, Q.R.; Thong, J.T.L. ; Phang, J.C.H. ; Fang, J.W.
19	2008	Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites	Wong, K.M. ; Chim, W.K. ; Huang, J.Q.; Zhu, L.
20	2004	Scaling properties of GOI MOSFETs in naon scale by full band Monte Carlo simulation	Liu, X.Y.; Du, G.; Xia, Z.L.; Kang, J.F.; Wang, Y.; Han, R.Q.; Yu, H.Y.; Li, M.-F. ; Kwong, D.L.