Publications

Results 1-9 of 9 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
120-Apr-2022Anneal-Free HZO-Based Ferroelectric Field-Effect Transistor for Back-End-of- Line-Compatible Monolithic 3D IntegrationTsai Shih-Hao; Chun-Kuei Chen; WANG XINGHUA ; UMESH CHAND ; SONU DEVI; Evgeny Zamburg ; THEAN VOON YEW, AARON 
28-Aug-2019Design of Artificial Spiking Neuron with SiO2 Memristive Synapse to Demonstrate Neuron-Level Spike Timing Dependent PlasticityNIU XUHUA ; LI YIDA ; UMESH CHAND ; LEONG JIN FENG ; EVGENY ZAMBURG ; THEAN VOON YEW, AARON 
36-May-2022Engineered Nucleotide Chemicapacitive Microsensor Array Augmented with Physics-Guided Machine Learning for High-Throughput Screening of CannabidiolYap, Stephanie Hui Kit ; Pan, Jieming ; Dao, Viet Linh ; Zhang, Xiangyu ; Wang, Xinghua ; Teo, Wei Zhe ; Zamburg, Evgeny ; Tham, Chen-Khong ; Yew, Wen Shan ; Poh, Chueh Loo ; Thean, Aaron Voon-Yew 
49-Feb-2021High Throughput, Area-Efficient, and Variation-Tolerant 3D In-memory Compute System for Deep Convolutional Neural NetworksEVGENY ZAMBURG ; LI YIDA ; THEAN VOON YEW, AARON 
52020Oxygen pressure influence on properties of nanocrystalline linbo3 films grown by laser ablationVakulov, Z.; Zamburg, E. ; Khakhulin, D.; Geldash, A.; Golosov, D.A.; Zavadski, S.M.; Miakonkikh, A.V.; Rudenko, K.V.; Dostanko, A.P.; He, Z.; Ageev, O.A.
62018Size effect on memristive properties of nanocrystalline ZnO film for resistive synaptic devicesShandyba, N.A.; Panchenko, I.V.; Tominov, R.V.; Smirnov, V.A.; Pelipenko, M.I.; Zamburg, E.G. ; Chu, Y.H.
713-Apr-2022Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect MemtransistorTsai Shih-Hao; Fang Zihang; WANG XINGHUA ; UMESH CHAND ; Chun-Kuei Chen; SONU DEVI ; SIVAN MAHESWARI; JIEMING PAN; Evgeny Zamburg ; THEAN VOON YEW, AARON 
82020Synthesis and memristor effect of a forming-free zno nanocrystalline filmsTominov, R.V.; Vakulov, Z.E.; Avilov, V.I.; Khakhulin, D.A.; Fedotov, A.A.; Zamburg, E.G. ; Smirnov, V.A.; Ageev, O.A.
928-Jun-2021Transfer learning-based artificial intelligence-integrated physical modeling to enable failure analysis for 3 nanometer and smaller silicon-based CMOS transistorsJIEMING PAN ; LOW KAIN LU ; JOYDEEP GHOSH ; Senthilnath Jayavelu; Md Meftahul Ferdaus; Shang Yi Lim; Evgeny Zamburg ; Li Yida ; TANG BAOSHAN ; WANG XINGHUA ; LEONG JIN FENG ; Savitha Ramasamy; Tonio Buonassisi; Tham Chen Khong ; THEAN VOON YEW, AARON