Please use this identifier to cite or link to this item:
https://doi.org/10.1021/acsaelm.1c01321
| Title: | Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor | Authors: | Tsai Shih-Hao Fang Zihang WANG XINGHUA UMESH CHAND Chun-Kuei Chen SONU DEVI SIVAN MAHESWARI JIEMING PAN Evgeny Zamburg THEAN VOON YEW, AARON |
Issue Date: | 13-Apr-2022 | Citation: | Tsai Shih-Hao, Fang Zihang, WANG XINGHUA, UMESH CHAND, Chun-Kuei Chen, SONU DEVI, SIVAN MAHESWARI, JIEMING PAN, Evgeny Zamburg, THEAN VOON YEW, AARON (2022-04-13). Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor. ScholarBank@NUS Repository. https://doi.org/10.1021/acsaelm.1c01321 | URI: | https://scholarbank.nus.edu.sg/handle/10635/224436 | DOI: | 10.1021/acsaelm.1c01321 |
| Appears in Collections: | Staff Publications Elements Students Publications |
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| File | Description | Size | Format | Access Settings | Version | |
|---|---|---|---|---|---|---|
| revision2_manuscript_SH3.pdf | 1.16 MB | Adobe PDF | OPEN | Post-print | View/Download |
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