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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 161-169 of 169 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1612001Single-image signal-to-noise ratio estimationThong, J.T.L. ; Sim, K.S. ; Phang, J.C.H. 
1622001Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscopeWong, W.K. ; Wei, Y.Z.; Phang, J.C.H. ; Thong, J.T.L. 
1631995Study of integrated circuits I-V characteristics using a fault localization systems [FLS]Quah, L.T.S.; Wong, W.K. ; Phang, J.C.H. ; Chan, D.S.H. ; Ho, P.Y.S.
1641999Study on LED degradation using CL, EBIC and a two-diode parameter extraction modelXiao, H.; Liu, Y.Y.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Yan, K.P.
1652009Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopyMeng, L.; Street, A.G.; Phang, J.C.H. 
1662010Thermal effects induced lateral head shift of thermal flying height control perpendicular magnetic recording headChen, Y.J.; Leong, S.H.; Huang, T.L.; Ho, H.W.; Ng, V. ; Phang, J.C.H. 
1671993True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide filmsLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
1681993True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide filmsLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
1691996Unconnected junction contrast in ion beam induced charge microscopyKolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.