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|Title:||Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope||Authors:||Wong, W.K.
|Issue Date:||2001||Citation:||Wong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository.||Source Title:||Scanning||URI:||http://scholarbank.nus.edu.sg/handle/10635/57464||ISSN:||01610457|
|Appears in Collections:||Staff Publications|
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