Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/57464
Title: | Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope | Authors: | Wong, W.K. Wei, Y.Z. Phang, J.C.H. Thong, J.T.L. |
Issue Date: | 2001 | Citation: | Wong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository. | Source Title: | Scanning | URI: | http://scholarbank.nus.edu.sg/handle/10635/57464 | ISSN: | 01610457 |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.