Please use this identifier to cite or link to this item:
|Title:||Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope|
|Authors:||Wong, W.K. |
|Citation:||Wong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository.|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 12, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.