Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/57464
Title: Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
Authors: Wong, W.K. 
Wei, Y.Z.
Phang, J.C.H. 
Thong, J.T.L. 
Issue Date: 2001
Source: Wong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository.
Source Title: Scanning
URI: http://scholarbank.nus.edu.sg/handle/10635/57464
ISSN: 01610457
Appears in Collections:Staff Publications

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