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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/57464
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dc.titleSpecimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope
dc.contributor.authorWong, W.K.
dc.contributor.authorWei, Y.Z.
dc.contributor.authorPhang, J.C.H.
dc.contributor.authorThong, J.T.L.
dc.date.accessioned2014-06-17T03:06:29Z
dc.date.available2014-06-17T03:06:29Z
dc.date.issued2001
dc.identifier.citationWong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository.
dc.identifier.issn01610457
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57464
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.sourcetitleScanning
dc.description.volume23
dc.description.issue2
dc.description.page114-115
dc.description.codenSCNND
dc.identifier.isiutNOT_IN_WOS
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