Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/57464
DC Field | Value | |
---|---|---|
dc.title | Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope | |
dc.contributor.author | Wong, W.K. | |
dc.contributor.author | Wei, Y.Z. | |
dc.contributor.author | Phang, J.C.H. | |
dc.contributor.author | Thong, J.T.L. | |
dc.date.accessioned | 2014-06-17T03:06:29Z | |
dc.date.available | 2014-06-17T03:06:29Z | |
dc.date.issued | 2001 | |
dc.identifier.citation | Wong, W.K.,Wei, Y.Z.,Phang, J.C.H.,Thong, J.T.L. (2001). Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscope. Scanning 23 (2) : 114-115. ScholarBank@NUS Repository. | |
dc.identifier.issn | 01610457 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/57464 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.sourcetitle | Scanning | |
dc.description.volume | 23 | |
dc.description.issue | 2 | |
dc.description.page | 114-115 | |
dc.description.coden | SCNND | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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