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https://scholarbank.nus.edu.sg/handle/10635/72947
| Title: | Study of integrated circuits I-V characteristics using a fault localization systems [FLS] | Authors: | Quah, L.T.S. Wong, W.K. Phang, J.C.H. Chan, D.S.H. Ho, P.Y.S. |
Issue Date: | 1995 | Citation: | Quah, L.T.S.,Wong, W.K.,Phang, J.C.H.,Chan, D.S.H.,Ho, P.Y.S. (1995). Study of integrated circuits I-V characteristics using a fault localization systems [FLS]. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 75-80. ScholarBank@NUS Repository. | Abstract: | A computer-controlled Fault Localization System [FLS] is used to investigate the variations of the I-V characteristics for different devices in terms of various criteria such as the area under the I-V characteristics, the area error and range error between a test device and a golden device. The use of the FLS in locating is also discussed. | Source Title: | Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA | URI: | http://scholarbank.nus.edu.sg/handle/10635/72947 |
| Appears in Collections: | Staff Publications |
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