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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/72947
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dc.titleStudy of integrated circuits I-V characteristics using a fault localization systems [FLS]
dc.contributor.authorQuah, L.T.S.
dc.contributor.authorWong, W.K.
dc.contributor.authorPhang, J.C.H.
dc.contributor.authorChan, D.S.H.
dc.contributor.authorHo, P.Y.S.
dc.date.accessioned2014-06-19T05:13:48Z
dc.date.available2014-06-19T05:13:48Z
dc.date.issued1995
dc.identifier.citationQuah, L.T.S.,Wong, W.K.,Phang, J.C.H.,Chan, D.S.H.,Ho, P.Y.S. (1995). Study of integrated circuits I-V characteristics using a fault localization systems [FLS]. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 75-80. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72947
dc.description.abstractA computer-controlled Fault Localization System [FLS] is used to investigate the variations of the I-V characteristics for different devices in terms of various criteria such as the area under the I-V characteristics, the area error and range error between a test device and a golden device. The use of the FLS in locating is also discussed.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleProceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
dc.description.page75-80
dc.description.coden00234
dc.identifier.isiutNOT_IN_WOS
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