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|Title:||Study of integrated circuits I-V characteristics using a fault localization systems [FLS]|
|Citation:||Quah, L.T.S.,Wong, W.K.,Phang, J.C.H.,Chan, D.S.H.,Ho, P.Y.S. (1995). Study of integrated circuits I-V characteristics using a fault localization systems [FLS]. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 75-80. ScholarBank@NUS Repository.|
|Abstract:||A computer-controlled Fault Localization System [FLS] is used to investigate the variations of the I-V characteristics for different devices in terms of various criteria such as the area under the I-V characteristics, the area error and range error between a test device and a golden device. The use of the FLS in locating is also discussed.|
|Source Title:||Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA|
|Appears in Collections:||Staff Publications|
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