Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/72947
Title: Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
Authors: Quah, L.T.S.
Wong, W.K. 
Phang, J.C.H. 
Chan, D.S.H. 
Ho, P.Y.S.
Issue Date: 1995
Source: Quah, L.T.S.,Wong, W.K.,Phang, J.C.H.,Chan, D.S.H.,Ho, P.Y.S. (1995). Study of integrated circuits I-V characteristics using a fault localization systems [FLS]. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 75-80. ScholarBank@NUS Repository.
Abstract: A computer-controlled Fault Localization System [FLS] is used to investigate the variations of the I-V characteristics for different devices in terms of various criteria such as the area under the I-V characteristics, the area error and range error between a test device and a golden device. The use of the FLS in locating is also discussed.
Source Title: Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
URI: http://scholarbank.nus.edu.sg/handle/10635/72947
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