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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Department:  ELECTRICAL & COMPUTER ENGINEERING
Department:  COLLEGE OF DESIGN AND ENGINEERING

Results 1-15 of 15 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1Jun-2013A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscopeChen, R.; Agarwal, K. ; Sheppard, C.J.R.; Phang, J.C.H. ; Chen, X. 
22005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
32005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
42009Applications of scanning near-field photon emission microscopyIsakov, D.V.; Tan, B.W.M.; Phang, J.C.H. ; Yeo, Y.C. ; Tio, A.A.B.; Zhang, Y.; Geinzer, T.; Balk, L.J.
52008Applications of scanning Near-field photon emission microscopyIsakov, D.; Tan, B.; Phang, J. ; Yeo, Y. ; Tio, A.; Zhang, Y.; Geinzer, T.; Balk, L.
62011Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning techniqueMeng, L.; Steen, S.; Koo, C.K. ; Bhatia, C.S. ; Street, A.G.; Joshi, P.; Kim, Y.H.; Phang, J.C.H. 
72001Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)Lee, T.H. ; Fiege, G.B.M.; Altes, A.; Zimmermann, G.; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
8Nov-2012Complete modeling of subsurface microscopy system based on aplanatic solid immersion lensChen, R.; Agarwal, K. ; Zhong, Y.; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
926-Sep-2011Dyadic Green's function for aplanatic solid immersion lens based sub-surface microscopyHu, L. ; Chen, R.; Agarwal, K. ; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
10May-2011Effect of polarization on a solid immersion lens of arbitrary thicknessLim, K.M.; Lee, G.C.F.; Sheppard, C.J.R. ; Phang, J.C.H. ; Wong, C.L.; Chen, X. 
11Sep-2002Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)Lee, T.H. ; Guo, X.; Shen, G.D.; Ji, Y.; Wang, G.H.; Du, J.Y.; Wang, X.Z.; Gao, G.; Altes, A.; Balk, Lj.; Phang, J.C.H. 
1221-Jan-2004Ion beam induced charge microscopy studies of power diodesZmeck, M.; Balk, L.J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
13Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
142007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
15Jun-2012Resolution of aplanatic solid immersion lens based microscopyChen, R.; Agarwal, K. ; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X.