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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]

Results 41-60 of 80 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
412009Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-systemTiedemann, A.-K.; Heiderhoff, R.; Balk, L.J.; Phang, J.C.H. 
422006Enhanced detection sensitivity with pulsed laser digital signal integration algorithmQuah, A.C.T.; Phang, J.C.H. ; Koh, L.S.; Tan, S.H.; Chua, C.M.
432004Enhanced pixel by pixel emissivity correction for thermal microscopyGoh, S.H.; Yim, K.H.; Phang, J.C.H. ; Balk, L.J.
44Sep-2009Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigationsTiedemann, A.-K.; Kurz, K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
45Sep-2002Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)Lee, T.H. ; Guo, X.; Shen, G.D.; Ji, Y.; Wang, G.H.; Du, J.Y.; Wang, X.Z.; Gao, G.; Altes, A.; Balk, Lj.; Phang, J.C.H. 
462005Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopyHendarto, E.; Altes, A.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
4721-Jan-2004Ion beam induced charge microscopy studies of power diodesZmeck, M.; Balk, L.J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
482009Laser timing probe with frequency mapping for locating signal maximaKoh, L.S.; Marks, H.; Ross, L.K.; Chua, C.M.; Phang, J.C.H. 
49Aug-2008Laser-induced detection sensitivity enhancement with laser pulsingQuah, A.C.T.; Chua, C.M.; Tan, S.H.; Koh, L.S.; Phang, J.C.H. ; Tan, T.L.; Gan, C.L.
502007Localization of Cu/low-k interconnect reliability defects by pulsed laser induced techniqueTan, T.L.; Quah, A.C.T.; Gan, C.L.; Phang, J.C.H. ; Chua, C.M.; Ng, C.M.; Du, A.-Y.
51Oct-2004Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror opticsChan, D.S.H. ; Liu, Y.Y.; Phang, J.C.H. ; Rau, E.; Sennov, R.; Gostev, A.V.
522010Mobile diffractive solid immersion lens design for backside laser based fault localizationGoh, S.H.; Cho, J.Y.; Lam, J.; Phang, J.C.H. 
53Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
5429-Aug-2011N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniquesTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
15Aug-2008Near-field detection of photon emission from silicon with 30 nm spatial resolutionIsakov, D.; Tio, A.A.B.; Geinzer, T.; Phang, J.C.H. ; Zhang, Y.; Balk, L.J.
162008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
172007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
187-Jul-2011Negative backside thermoreflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
192001New signal detection methods for thermal beam induced phenomenonPalaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.; Phang, J.C.H. ; Gilfeather, G.
202013Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopyMeng, L.; Papa Rao, S.S.; Bhatia, C.S. ; Steen, S.E.; Street, A.G.; Phang, J.C.H.