Please use this identifier to cite or link to this item:
|Title:||Laser-induced detection sensitivity enhancement with laser pulsing||Authors:||Quah, A.C.T.
|Issue Date:||Aug-2008||Citation:||Quah, A.C.T.,Chua, C.M.,Tan, S.H.,Koh, L.S.,Phang, J.C.H.,Tan, T.L.,Gan, C.L. (2008-08). Laser-induced detection sensitivity enhancement with laser pulsing. Electronic Device Failure Analysis 10 (3) : 18-26. ScholarBank@NUS Repository.||Abstract:||This article describes a pulsed laser-induced digital signal integration algorithm for pulsed laser operation that is compatible with existing ac-coupled detection systems for fault localization. This algorithm enhances laser-induced detection sensitivity without a lock-in amplifier. The best detection sensitivity is achieved at a pulsing frequency range between 500 Hz and 1.5 kHz. Within this frequency range, the algorithm is capable of achieving more than nine times the enhancement in detection sensitivity. Applications of pulsed TIVA for fault localization are described. ©ASM International®.||Source Title:||Electronic Device Failure Analysis||URI:||http://scholarbank.nus.edu.sg/handle/10635/56467||ISSN:||15370755|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jun 10, 2021
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.