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Huan Cheng Hon,Alfred

rp06875

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Full Name
Huan Cheng Hon,Alfred
(not current staff)
Variants
Huan, Cha
Huan, A.H.
Huan, C.H.A.
Huan, A.C.H.
Huan, C.H.
Huan, Alfred C.H.
Alfred, C.H.H.
Huan, C.-H.A.
Huan, A.
 
Main Affiliation
 
Faculty
 
Email
phyhuana@nus.edu.sg
 

Publications

Refined By:
Author:  Wee, A.T.S.
Author:  Tan, K.L.

Results 1-19 of 19 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Jan-1994A comparative study of the initial oxygen and water reactions on germanium and silicon using simsWee, A.T.S. ; Huan, C.H.A. ; Thong, P.S.P.; Tan, K.L. 
21-Jun-1997AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beamsPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
3Dec-1996AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantationPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
41-Dec-1995An alternative method for determining the transmission function of secondary ion mass spectrometersLow, M.H.S.; Huan, C.H.A. ; Wee, A.T.S. ; Tan, K.L. 
5Jan-1994An investigation of the Ar+ ion-enhanced reaction of CCl4 on Si(100) by secondary ion mass spectrometryWee, A.T.S. ; Huan, C.H.A. ; Tan, K.L. ; Tan, R.S.K.
615-Mar-1996Argon incorporation and silicon carbide formation during low energy argon-ion bombardment of Si(100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
715-Dec-1996Argon incorporation and surface compositional changes in InP(100) due to low-energy Ar+ ion bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
821-Sep-1997ARXPS analysis of surface compositional change in Ar+ ion bombarded GaAs (100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
9Jul-1998Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAsPan, J.S. ; Huan, C.H.A. ; Wee, A.T.S. ; Tan, H.S. ; Tan, K.L. 
101994Investigation of titanium silicide formation using secondary ion mass spectrometryWee, Andrew T.S. ; Huan, Alfred C.H. ; Thian, W.H.; Tan, K.L. ; Hogan, Royston
1127-Oct-1997Ionization probability of Si+ ion emission from clean Si under Ar+ bombardmentLow, M.H.S.; Huan, C.H.A. ; Wee, A.T.S. ; Tan, K.L. 
12Feb-1996Secondary ion emission from silicon under 8 keV O2 + and Ar+ ion bombardmentHuan, C.H.A. ; Wee, A.T.S. ; Low, H.S.M.; Tan, K.L. 
131-Mar-1994SIMS study of NO, CO adsorption on Cu(100) and Cu(210) surfacesWee, A.T.S. ; Lin, J. ; Huan, A.C.H. ; Loh, F.C. ; Tan, K.L. 
14Jan-1993Static SIMS of conjugated polymers: films of the substituted polyacetylenesHuan, C.H.A. ; Wee, A.T.S. ; Gopalakrishnan, R. ; Tan, K.L. ; Kang, E.T. ; Neoh, K.G. ; Liaw, D.J.
15Nov-1991Static SIMS of polyacetylene: the effect of chain unsaturationWee, A.T.S. ; Huan, C.H.A. ; Gopalakrishnan, R. ; Tan, K.L. ; Kang, E.T. ; Neoh, K.G. ; Shirakawa, H.
161-Sep-1996Surface and interface studies of titanium silicide formationWee, A.T.S. ; Huan, A.C.H. ; Osipowicz, T. ; Lee, K.K.; Thian, W.H.; Tan, K.L. ; Hogan, R.
17Feb-1993Surface studies of chemically processed polyaniline filmsKang, E.T. ; Neoh, K.G. ; Woo, Y.L.; Tan, K.L. ; Huan, C.H.A. ; Wee, A.T.S. 
181993The interaction between CO and YBa2Cu3Ox as studied by TG/DTA, FTIR, and XPSLin, J. ; Neoh, K.G. ; Li, N. ; Tan, T.C. ; Wee, A.T.S. ; Huan, A.C.H. ; Tan, K.L. 
1914-Dec-1996XPS studies on nitridation of InP(100) surface by N+ 2 ion beam bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.