1. ScholarBank@NUS

Huan Cheng Hon,Alfred

rp06875

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Huan Cheng Hon,Alfred
(not current staff)
Variants
Huan, Cha
Huan, A.H.
Huan, C.H.A.
Huan, A.C.H.
Huan, C.H.
Huan, Alfred C.H.
Alfred, C.H.H.
Huan, C.-H.A.
Huan, A.
 
Main Affiliation
 
Faculty
 
Email
phyhuana@nus.edu.sg
 

Publications

Refined By:
Department:  PHYSICS
Type:  Conference Paper

Results 1-12 of 12 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Aug-2002Characterization of fluoropolymer films deposited by magnetron sputtering of poly(tetrafluoroethylene) and plasma polymerization of heptadecafluoro-1-decene (HDFD) on (100)-oriented single-crystal silicon substratesZhang, Y. ; Yang, G.H.; Kang, E.T. ; Neoh, K.G. ; Huang, W. ; Huan, A.C.H. ; Lai, D.M.Y.
22000Effect of ITO carrier concentration on the performance of organic light-emitting diodesZhu, F.; Zhang, K.; Huan, C.H.A. ; Wee, A.T.S. ; Guenther, E.; Jin, C.S.
3May-2001Effects of oxygen flooding on crater bottom composition and roughness in ultrashallow secondary ion mass spectrometry depth profilingNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.
48-Nov-2004Energy-band alignments at ZrO2/Si, SiGe, and Ge interfacesWang, S.J.; Huan, A.C.H. ; Foo, Y.L.; Chai, J.W.; Pan, J.S.; Li, Q.; Dong, Y.F.; Feng, Y.P. ; Ong, C.K. 
5Aug-2001Influence of sulphonation on polymer and polymer blend surfaces studied by atomic force microscopyWee, A.T.S. ; Guo, Y.P. ; Tan, K.C.; Wang, H.Q. ; Leong, T.K.; Huan, C.H.A. 
61994Investigation of titanium silicide formation using secondary ion mass spectrometryWee, Andrew T.S. ; Huan, Alfred C.H. ; Thian, W.H.; Tan, K.L. ; Hogan, Royston
710-Jun-2003Probing the behaviour of ultra thin Co layers on clean and hydrogen terminated Si(0 0 1) and Si(1 1 1) surfacesPan, J.S.; Tok, E.S. ; Huan, C.H.A. ; Liu, R.S. ; Chai, J.W.; Ong, W.J.; Toh, K.C.
831-Mar-2006Quantitative measurement of image intensity in transmission electron microscope imagesQu, W.; Boothroyd, C. ; Huan, A. 
91-Aug-2004Selective growth of GaAs quantum dots on the triangle nanocavities bounded by SiO2 mask on Si substrate by MBEZheng, Y.B.; Chua, S.J. ; Huan, C.H.A. ; Miao, Z.L.
10Apr-2003Study of a computational-time-saving scheme for quantitative LEED analysis by the matrix inversion methodSun, Y.Y. ; Wee, A.T.S. ; Huan, A.C.H. 
1125-Apr-2005The epitaxial ZrO2 on silicon as alternative gate dielectric: Film growth, characterization and electronic structure calculationsWang, S.J.; Dong, Y.F.; Huan, C.H.A. ; Feng, Y.P. ; Ong, C.K. 
122000Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6fNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.