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Eng Soon Tok

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Full Name
Eng Soon Tok
Variants
Tok, E.-S.
Tok, E.
TOK, E.S.T
Tok, Eng Soon
Tok Eng Soon
Soon Tok, E.
Tok E.S.
Tok, E.S.
 
Main Affiliation
 
Faculty
 
Email
phytokes@nus.edu.sg
 

Publications

Refined By:
Author:  Tok, E.S.
Type:  Conference Paper

Results 1-13 of 13 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Apr-2005Determination of local lattice tilt in Si1-xGex virtual substrate using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S. ; Watt, F. 
22007Direct observation of carbon nanostructures growth using in-situ ultrahigh vacuum transmission electron microscopyFoo, Y.L.; Lin, M.; Tan, J.P.Y.; Boothroyd, C.B.; Tok, E.S. 
3Apr-2003Dynamics and surface segregation during GSMBE of Si1-yCy and Si1-x-yGexCy on the Si(0 0 1) surfacePrice, R.W.; Tok, E.S. ; Liu, R. ; Wee, A.T.S. ; Woods, N.J.; Zhang, J.
415-May-2012Electrical and photoresponse properties of Co 3O 4 nanowiresVarghese, B. ; Mukherjee, B.; Karthik, K.R.G.; Jinesh, K.B.; Mhaisalkar, S.G.; Soon Tok, E. ; Haur Sow, C.
52013Germanium-Tin (GeSn) N-channel MOSFETs with low temperature silicon surface passivationGuo, P.; Zhan, C.; Yang, Y.; Gong, X.; Liu, B.; Cheng, R. ; Wang, W.; Pan, J.; Zhang, Z.; Tok, E.S. ; Han, G. ; Yeo, Y.-C. 
614-Feb-2002Growth mechanisms in thin film epitaxy of Si/SiGe from hydridesZhang, J.; Woods, N.J.; Breton, G.; Price, R.W.; Hartell, A.D.; Lau, G.S.; Liu, R. ; Wee, A.T.S. ; Tok, E.S. 
7May-2002High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structuresOsipowicz, T. ; Seng, H.L. ; Wielunski, L.S.; Tok, E.S. ; Breton, G.; Zhang, J.
8Sep-2003High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layersSeng, H.L. ; Osipowicz, T. ; Sum, T.C. ; Breese, M.B.H. ; Watt, F. ; Tok, E.S. ; Zhang, J.
9May-2002Optimal geometry for GeSi/Si super-lattice structure RBS investigationWielunski, L.S.; Osipowicz, T. ; Teo, E.J. ; Watt, F. ; Tok, E.S. ; Zhang, J.
1010-Jun-2003Probing the behaviour of ultra thin Co layers on clean and hydrogen terminated Si(0 0 1) and Si(1 1 1) surfacesPan, J.S.; Tok, E.S. ; Huan, C.H.A. ; Liu, R.S. ; Chai, J.W.; Ong, W.J.; Toh, K.C.
11Jul-2012Sub-bandgap energy photoresponse of individual V 2O 5 nanowiresTamang, R. ; Varghese, B. ; Tok, E.S. ; Mhaisalkar, S.; Sow, C.H. 
12Jul-2001The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)Hartell, A.D.; Tok, E.S. ; Zhang, J.
1310-Jun-2003The effects of carbon incorporation during GSMBE of Si1-yCy and Si1-x-yGexCy: Growth dynamics and segregationPrice, R.W.; Tok, E.S. ; Woods, N.J.; Zhang, J.