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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1950 TO 1999]

Results 1-20 of 46 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
11996A multi-technique study of the surface preparation of InSb substrate and subsequently grown CdTe films by molecular beam epitaxyFeng, Z.C. ; Gong, H. ; Choyke, W.J.; Doyle, N.J.; Farrow, R.F.C.
21994A novel scanning electron microscope method for the investigation of charge trapping in insulatorsGong, H. ; Ong, C.K. 
31-May-1996A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiationSong, Z.G.; Ong, C.K. ; Gong, H. 
43-Mar-1998Anisothermal oxidation of micro-crystalline Ni-20Cr-5Al alloy coating at 850-1280°CLiu, Z.; Gao, W.; Gong, H. 
51998Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurementCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
6Jan-1996Backscattering factor for KLL Auger yield from film-substrate systemsLee, C.L. ; Kong, K.Y.; Gong, H. ; Ong, C.K. 
71997Breakdown of reoxidized nitrided oxide (ONO) in Flash memory devices upon current stressingCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.
81993Charge trapping on different cuts of a single-crystalline α-SiO 2Gong, H. ; Le Gressus, C.; Oh, K.H. ; Ding, X.Z.; Ong, C.K. ; Tan, B.T.G. 
9Dec-1995Charging of deformed semicrystalline polymers observed with a scanning electron microscopeGong, H. ; Chooi, K.M.; Ong, C.K. 
101994Classical electron trajectory in scanning electron microscope mirror image methodChen, H.; Gong, H. ; Ong, C.K. 
111997Constant current-stress induced breakdown of reoxidized nitrided oxide (ONO) in Flash memory devicesCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.
12Sep-1994Copper as an electron trap in GaAs0.6P0.4Tan, H.S. ; Han, M.K. ; Hu, P.Y.; Zheng, J.H.; Ng, S.C. ; Gong, H. 
131994Dependence of charging on crystallographic orientations of an as-grown α-quartzGong, H. ; Taijing, L. ; Ong, C.K. 
141995Determination of charge distribution volume in electron irradiated insulators by scanning electron microscopeChen, H.; Gong, H. ; Ong, C.K. 
151993Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope techniqueOh, K.H. ; Le Gressus, C.; Gong, H. ; Ong, C.K. ; Tan, B.T.G. ; Ding, X.Z.
1617-Feb-1997Discharging behaviour on insulator surfaces in vacuum: A scanning electron microscopy observationGong, H. ; Ong, C.K. 
1727-Oct-1997Dynamics aspects of the charging behaviour of polymers under focused electron beam irradiationOng, C.K. ; Song, Z.G.; Gong, H. 
181994Effect of conjugated bonds on the charging of insulating polymersGong, H. ; Chooi, K.M.; Ong, C.K. 
191999Effect of Cu contamination on electrical characteristics for PMOS transistorsTee, K.C.; Prasad, K.; Lee, C.S.; Gong, H. ; Chan, L.; See, A.K.
201997Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devicesCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.