Full Name
Lu Taijin
Variants
Taijing, L.
Lu Taijing
Lu, T.
Taijing, Lu
Lu, T.J.
 
Main Affiliation
 
Faculty
 

Publications

Results 1-16 of 16 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1Jan-1994Characterization of GdBa2Cu3O7-x superconducting thin films by a new optical interference fringe methodMai, Z.H.; Dai, D.Y.; Wang, R.L.; Yi, H.R.; Wang, C.A.; Li, H.C.; Lu, T.J. ; Li, L.; Ogawa, T.
2Oct-1994Characterization of striations in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometerTaijing, Lu ; Ng, S.C. 
3Apr-1996Characterization of surface microroughness of silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometerTaijing, L. ; Ng, S.C. ; Furukawa, J.; Furuya, H.
41997Crystallization study of heavy metal fluoride glasses ZBLAN by Raman spectroscopyQin, L.; Shen, Z.X. ; Low, B.L.; Lee, H.K. ; Lu, T.J. ; Dai, Y.S.; Tang, S.H. ; Kuok, M.H. 
51994Dependence of charging on crystallographic orientations of an as-grown α-quartzGong, H. ; Taijing, L. ; Ong, C.K. 
6Jul-1993Detection of oxidation stacking faults in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometerNg, S.C. ; Taijing, L. 
71993Effect of surface structures upon ultrathin film interference fringesTaijing, Lu ; Ogawa, Tomoya; Toyoda, Koichi; Wang, Zhenguo
81-Feb-1998Effects of impurities on dielectric properties of fluorozirconate glasses at microwave frequenciesDing, X.Z.; Taijing, L. ; Ong, C.K. ; Tan, B.T.G. ; Dai, Y.
91994Effects of impurity concentration on dielectric loss in Zn-doped InP at microwave X-band frequenciesDing, X.Z.; Taijing, L. ; Ong, C.K. ; Tan, B.T.G. 
101-Jun-1995Formation mechanism of tapering of crystals: a comparative study between potassium dihydrogen phosphate crystals and natural quartz crystalsLu, T. ; Yallee, R.B.; Ong, C.K. ; Sunagawa, I.
111994Microwave dielectric resonance of a fluoride glassTaijing, L. ; Dai, Y.; Ding, X.Z.; Ong, C.K. ; Tan, B.T.G. 
121995Nanometre scale textures in agate and Beltane opalLu Taijing ; Zhang, X. ; Sunagawa, I.; Groves, G.W.
13Feb-1996Size distribution of ultrafine particles in KDP aqueous solutionsLian, L. ; Taijing, L. ; Zaizu, Y.; Ogawa, T.
14Dec-1994Study of surface microtopography of InAlAs/InP heterostructures grown by MBETaijing, L. ; Zhenhoug, M.; Chao, J.; Sekiguchi, T.; Ong, C.K. ; Ogawa, T.; Ming, Z.J.; Sumino, K.
151-Jul-1996Temperature evolution of domains in potassium niobate single crystalsLian, L. ; Chong, T.C. ; Kumagai, H.; Hirano, M.; Taijing, L. ; Ng, S.C. 
16Mar-1995Vacuum pump coaxial probe system for measurement of dielectric properties of materials with smooth surfacesDing, X.Z.; Taijing, Lu ; Ong, C.K. ; Tan, B.T.G.