Dependence of charging on crystallographic orientations of an as-grown α-quartz

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.357803

Title:	Dependence of charging on crystallographic orientations of an as-grown α-quartz
Authors:	Gong, H. Taijing, L. Ong, C.K.
Issue Date:	1994
Citation:	Gong, H., Taijing, L., Ong, C.K. (1994). Dependence of charging on crystallographic orientations of an as-grown α-quartz. Journal of Applied Physics 76 (2) : 1352-1354. ScholarBank@NUS Repository. https://doi.org/10.1063/1.357803
Abstract:	The scanning electron microscope copper-detector technique introduced most recently by H. Gong and C. K. Ong [J. Appl. Phys. 75, 449 (1994)] is employed for the investigation of charging on faces m {101̄0}, R {101̄1}, and χ {516̄1} of single-crystalline α-quartz. It is found that the charging ability decreases in the order of m, R, and χ, revealing the dependence of charging on crystallographic orientations, and these results are confirmed by the well-established mirror-image method. In addition, the experimental results also suggest that not only electron-irradiation-induced defects but also intrinsic defects are responsible for charge trapping.
Source Title:	Journal of Applied Physics
URI:	http://scholarbank.nus.edu.sg/handle/10635/96168
ISSN:	00218979
DOI:	10.1063/1.357803
Appears in Collections:	Staff Publications

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